{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,8]],"date-time":"2026-05-08T15:50:32Z","timestamp":1778255432134,"version":"3.51.4"},"reference-count":35,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,3]]},"DOI":"10.1109\/irps48227.2022.9764435","type":"proceedings-article","created":{"date-parts":[[2022,5,2]],"date-time":"2022-05-02T16:44:23Z","timestamp":1651509863000},"page":"10A.2-1-10A.2-7","source":"Crossref","is-referenced-by-count":6,"title":["A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for LDMOS Transistors"],"prefix":"10.1109","author":[{"given":"Bikram Kishore","family":"Mahajan","sequence":"first","affiliation":[{"name":"Purdue University,Elmore Family School of Electrical and Computer Engineering,West Lafayette,IN,United States,47906"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yen-Pu","family":"Chen","sequence":"additional","affiliation":[{"name":"Purdue University,Elmore Family School of Electrical and Computer Engineering,West Lafayette,IN,United States,47906"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Muhammad Ashraful","family":"Alam","sequence":"additional","affiliation":[{"name":"Purdue University,Elmore Family School of Electrical and Computer Engineering,West Lafayette,IN,United States,47906"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dhanoop","family":"Varghese","sequence":"additional","affiliation":[{"name":"Texas Instruments Inc.,Dallas,TX,United States,75243"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Srikanth","family":"Krishnan","sequence":"additional","affiliation":[{"name":"Texas Instruments Inc.,Dallas,TX,United States,75243"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vijay","family":"Reddy","sequence":"additional","affiliation":[{"name":"Texas Instruments Inc.,Dallas,TX,United States,75243"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/16.293352"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1999.824251"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2714(01)00139-1"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2011.2135835"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2006.876310"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2000.843886"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2018.2792539"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2227321"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2017.07.043"},{"key":"ref13","first-page":"309","article-title":"Characterization and Modeling of High-Voltage LDMOS Transistors BT - Hot Carrier Degradation in Semiconductor Devices","author":"reggiani","year":"2015"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS45951.2020.9128965"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1063\/5.0058477"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS46558.2021.9405224"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.3046168"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS48227.2022.9764450"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.813333"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1984.21472"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2941445"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1969.16744"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/EDTM50988.2021.9421019"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/S0038-1101(98)00282-2"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.876041"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/0038-1101(93)90149-K"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3084915"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2059632"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.904587"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2015.08.014"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2014.03.013"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.3021360"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ISPSD.2011.5890813"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2160023"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/16.405281"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2006.873767"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/0038-1101(62)90111-9"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1063\/1.1663719"}],"event":{"name":"2022 IEEE International Reliability Physics Symposium (IRPS)","location":"Dallas, TX, USA","start":{"date-parts":[[2022,3,27]]},"end":{"date-parts":[[2022,3,31]]}},"container-title":["2022 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9764406\/9764408\/09764435.pdf?arnumber=9764435","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,14]],"date-time":"2022-06-14T16:41:32Z","timestamp":1655224892000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9764435\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,3]]},"references-count":35,"URL":"https:\/\/doi.org\/10.1109\/irps48227.2022.9764435","relation":{},"subject":[],"published":{"date-parts":[[2022,3]]}}}