{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,16]],"date-time":"2026-07-16T15:04:29Z","timestamp":1784214269036,"version":"3.55.0"},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,3]]},"DOI":"10.1109\/irps48227.2022.9764441","type":"proceedings-article","created":{"date-parts":[[2022,5,2]],"date-time":"2022-05-02T20:44:23Z","timestamp":1651524263000},"page":"1-5","source":"Crossref","is-referenced-by-count":24,"title":["Layer-to-Layer Endurance Variation of 3D NAND Flash Memory"],"prefix":"10.1109","author":[{"given":"Md","family":"Raquibuzzaman","sequence":"first","affiliation":[{"name":"The University of Alabama in Huntsville,Electrical and Computer Engineering Department,AL,USA,35899"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Md Mehedi","family":"Hasan","sequence":"additional","affiliation":[{"name":"Stony Brook University,Department of Computer Science,Stony Brook,NY,USA,11794"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Aleksandar","family":"Milenkovic","sequence":"additional","affiliation":[{"name":"The University of Alabama in Huntsville,Electrical and Computer Engineering Department,AL,USA,35899"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Biswajit","family":"Ray","sequence":"additional","affiliation":[{"name":"The University of Alabama in Huntsville,Electrical and Computer Engineering Department,AL,USA,35899"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2413841"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2017.2747631"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.3012927"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2020.3014261"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2018.8614694"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.2968079"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2017.2675160"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2697000"},{"key":"ref8","first-page":"67","article-title":"{PEN}: Design and Evaluation of Partial-Erase for 3D NAND-Based High Density SSDs","author":"liu","year":"2018"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/SMARTCOMP.2014.7043841"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2012.6478961"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2665781"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3316781.3317929"}],"event":{"name":"2022 IEEE International Reliability Physics Symposium (IRPS)","location":"Dallas, TX, USA","start":{"date-parts":[[2022,3,27]]},"end":{"date-parts":[[2022,3,31]]}},"container-title":["2022 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9764406\/9764408\/09764441.pdf?arnumber=9764441","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,14]],"date-time":"2022-06-14T20:42:06Z","timestamp":1655239326000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9764441\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,3]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/irps48227.2022.9764441","relation":{},"subject":[],"published":{"date-parts":[[2022,3]]}}}