{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,29]],"date-time":"2026-04-29T18:33:50Z","timestamp":1777487630739,"version":"3.51.4"},"reference-count":5,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,3]]},"DOI":"10.1109\/irps48227.2022.9764459","type":"proceedings-article","created":{"date-parts":[[2022,5,2]],"date-time":"2022-05-02T16:44:23Z","timestamp":1651509863000},"page":"4A.2-1-4A.2-4","source":"Crossref","is-referenced-by-count":11,"title":["MTJ degradation in SOT-MRAM by self-heating-induced diffusion"],"prefix":"10.1109","author":[{"given":"Simon","family":"Van Beek","sequence":"first","affiliation":[{"name":"Imec,Leuven,Belgium,3001"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kaiming","family":"Cai","sequence":"additional","affiliation":[{"name":"Imec,Leuven,Belgium,3001"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Siddharth","family":"Rao","sequence":"additional","affiliation":[{"name":"Imec,Leuven,Belgium,3001"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ganesh","family":"Jayakumar","sequence":"additional","affiliation":[{"name":"Imec,Leuven,Belgium,3001"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sebastien","family":"Couet","sequence":"additional","affiliation":[{"name":"Imec,Leuven,Belgium,3001"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nico","family":"Jossart","sequence":"additional","affiliation":[{"name":"Imec,Leuven,Belgium,3001"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Adrian","family":"Chasin","sequence":"additional","affiliation":[{"name":"Imec,Leuven,Belgium,3001"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gouri Sankar","family":"Kar","sequence":"additional","affiliation":[{"name":"Imec,Leuven,Belgium,3001"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","first-page":"1","article-title":"Beol compatible high retention perpendicular sot-mram device for sram replacement and machine learning","author":"couet","year":"2021","journal-title":"2021 Symposium on VLSI Tech-nology"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2018.8502269"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2731959"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.100.057206"},{"key":"ref1","first-page":"1","article-title":"Edge-induced reliability amp; performance degradation in stt-mram: an etch engineering solution","author":"van beek","year":"2021","journal-title":"2021 IEEE International Reliability Physics Symposium (IRPS)"}],"event":{"name":"2022 IEEE International Reliability Physics Symposium (IRPS)","location":"Dallas, TX, USA","start":{"date-parts":[[2022,3,27]]},"end":{"date-parts":[[2022,3,31]]}},"container-title":["2022 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9764406\/9764408\/09764459.pdf?arnumber=9764459","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,13]],"date-time":"2022-06-13T17:14:29Z","timestamp":1655140469000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9764459\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,3]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/irps48227.2022.9764459","relation":{},"subject":[],"published":{"date-parts":[[2022,3]]}}}