{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,20]],"date-time":"2025-05-20T09:56:10Z","timestamp":1747734970890,"version":"3.37.3"},"reference-count":5,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000028","name":"Semiconductor Research Corporation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000028","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,3]]},"DOI":"10.1109\/irps48227.2022.9764518","type":"proceedings-article","created":{"date-parts":[[2022,5,2]],"date-time":"2022-05-02T20:44:23Z","timestamp":1651524263000},"page":"P2-1-P2-6","source":"Crossref","is-referenced-by-count":3,"title":["A Calibration-Free Synthesizable Odometer Featuring Automatic Frequency Dead Zone Escape and Start-up Glitch Removal"],"prefix":"10.1109","author":[{"given":"Tahmida","family":"Islam","sequence":"first","affiliation":[{"name":"University of Minnesota,Department of Electrical and Computer Engineering,Minneapolis,MN,USA,55455"}]},{"given":"Junkyu","family":"Kim","sequence":"additional","affiliation":[{"name":"University of Minnesota,Department of Electrical and Computer Engineering,Minneapolis,MN,USA,55455"}]},{"given":"Chris H.","family":"Kim","sequence":"additional","affiliation":[{"name":"University of Minnesota,Department of Electrical and Computer Engineering,Minneapolis,MN,USA,55455"}]},{"given":"David","family":"Tipple","sequence":"additional","affiliation":[{"name":"NXP Semiconductors,Austin,TX,USA,78735"}]},{"given":"Michael","family":"Nelson","sequence":"additional","affiliation":[{"name":"NXP Semiconductors,Austin,TX,USA,78735"}]},{"given":"Robert","family":"Jin","sequence":"additional","affiliation":[{"name":"NXP Semiconductors,Austin,TX,USA,78735"}]},{"given":"Anis","family":"Jarrar","sequence":"additional","affiliation":[{"name":"NXP Semiconductors,Austin,TX,USA,78735"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS46558.2021.9405181"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2160813"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2009.2015160"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2040125"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2007.4342682"}],"event":{"name":"2022 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2022,3,27]]},"location":"Dallas, TX, USA","end":{"date-parts":[[2022,3,31]]}},"container-title":["2022 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9764406\/9764408\/09764518.pdf?arnumber=9764518","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,14]],"date-time":"2022-06-14T20:41:43Z","timestamp":1655239303000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9764518\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,3]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/irps48227.2022.9764518","relation":{},"subject":[],"published":{"date-parts":[[2022,3]]}}}