{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,8]],"date-time":"2026-05-08T16:11:29Z","timestamp":1778256689197,"version":"3.51.4"},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,3]]},"DOI":"10.1109\/irps48227.2022.9764573","type":"proceedings-article","created":{"date-parts":[[2022,5,2]],"date-time":"2022-05-02T20:44:23Z","timestamp":1651524263000},"page":"P26-1-P26-4","source":"Crossref","is-referenced-by-count":2,"title":["Robust Off-State TDDB Reliability of n-LDMOS"],"prefix":"10.1109","author":[{"given":"Wen","family":"Liu","sequence":"first","affiliation":[{"name":"GLOBALFOUNDRIES,Essex Junction,VT,U.S.A"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dimitris P.","family":"Ioannou","sequence":"additional","affiliation":[{"name":"GLOBALFOUNDRIES,Hopewell Junction,NY,U.S.A."}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Johnatan","family":"Kantarovsky","sequence":"additional","affiliation":[{"name":"GLOBALFOUNDRIES,Essex Junction,VT,U.S.A"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Byoung","family":"Min","sequence":"additional","affiliation":[{"name":"GLOBALFOUNDRIES,Malta,NY,U.S.A."}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tanya","family":"Nigam","sequence":"additional","affiliation":[{"name":"GLOBALFOUNDRIES,Santa Clara,CA,U.S.A."}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2004.829036"},{"key":"ref3","first-page":"84","article-title":"OFF-state mode TDDB reliability for ultrathin gate oxides: New methodology and the impact of oxide thickness scaling","author":"wu","year":"2004","journal-title":"IRPS"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2002.996611"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2016.7574575"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6532022"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/BCTM.2014.6981293"}],"event":{"name":"2022 IEEE International Reliability Physics Symposium (IRPS)","location":"Dallas, TX, USA","start":{"date-parts":[[2022,3,27]]},"end":{"date-parts":[[2022,3,31]]}},"container-title":["2022 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9764406\/9764408\/09764573.pdf?arnumber=9764573","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,14]],"date-time":"2022-06-14T20:42:04Z","timestamp":1655239324000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9764573\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,3]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/irps48227.2022.9764573","relation":{},"subject":[],"published":{"date-parts":[[2022,3]]}}}