{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,16]],"date-time":"2026-05-16T09:18:52Z","timestamp":1778923132519,"version":"3.51.4"},"reference-count":7,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,3]]},"DOI":"10.1109\/irps48227.2022.9764576","type":"proceedings-article","created":{"date-parts":[[2022,5,2]],"date-time":"2022-05-02T20:44:23Z","timestamp":1651524263000},"page":"P36-1-P36-4","source":"Crossref","is-referenced-by-count":2,"title":["Combining measurements and modeling\/simulations analysis to assess carbon nanotube memory cell characteristics"],"prefix":"10.1109","author":[{"given":"J.","family":"Farmer","sequence":"first","affiliation":[{"name":"The Aerospace Corporation,MTD,Los Angeles,CA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Veksler","sequence":"additional","affiliation":[{"name":"The Aerospace Corporation,MTD,Los Angeles,CA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.","family":"Tang","sequence":"additional","affiliation":[{"name":"The Aerospace Corporation,MTD,Los Angeles,CA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Bersuker","sequence":"additional","affiliation":[{"name":"The Aerospace Corporation,MTD,Los Angeles,CA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D. Z.","family":"Gao","sequence":"additional","affiliation":[{"name":"Nanolayers Research Computing LTD,UK"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.-M.","family":"El-Sayed","sequence":"additional","affiliation":[{"name":"Nanolayers Research Computing LTD,UK"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Durrant","sequence":"additional","affiliation":[{"name":"Nanolayers Research Computing LTD,UK"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Shluger","sequence":"additional","affiliation":[{"name":"UCL,London,UK"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Rueckes","sequence":"additional","affiliation":[{"name":"Nantero Inc.,Woburn,MA,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Cleveland","sequence":"additional","affiliation":[{"name":"Nantero Inc.,Woburn,MA,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H.","family":"Luan","sequence":"additional","affiliation":[{"name":"Nantero Inc.,Woburn,MA,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"Sen","sequence":"additional","affiliation":[{"name":"Nantero Inc.,Woburn,MA,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/B978-0-08-102584-0.00002-4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1063\/1.5143190"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1149\/MA2020-02312039mtgabs"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS46558.2021.9405123"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2018.8614512"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.71.165417"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1021\/nl9020914"}],"event":{"name":"2022 IEEE International Reliability Physics Symposium (IRPS)","location":"Dallas, TX, USA","start":{"date-parts":[[2022,3,27]]},"end":{"date-parts":[[2022,3,31]]}},"container-title":["2022 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9764406\/9764408\/09764576.pdf?arnumber=9764576","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,13]],"date-time":"2022-06-13T21:14:14Z","timestamp":1655154854000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9764576\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,3]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/irps48227.2022.9764576","relation":{},"subject":[],"published":{"date-parts":[[2022,3]]}}}