{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,8]],"date-time":"2026-05-08T16:11:22Z","timestamp":1778256682890,"version":"3.51.4"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,3,1]],"date-time":"2022-03-01T00:00:00Z","timestamp":1646092800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,3]]},"DOI":"10.1109\/irps48227.2022.9764587","type":"proceedings-article","created":{"date-parts":[[2022,5,2]],"date-time":"2022-05-02T20:44:23Z","timestamp":1651524263000},"page":"P3-1-P3-5","source":"Crossref","is-referenced-by-count":6,"title":["A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies"],"prefix":"10.1109","author":[{"given":"P.","family":"Saraza-Canflanca","sequence":"first","affiliation":[{"name":"IMSE-CNM (CSIC\/Universidad de Sevilla),Instituto de Microelectrónica de Sevilla,Sevilla,Spain,41092"}]},{"given":"H.","family":"Carrasco-Lopez","sequence":"additional","affiliation":[{"name":"IMSE-CNM (CSIC\/Universidad de Sevilla),Instituto de Microelectrónica de Sevilla,Sevilla,Spain,41092"}]},{"given":"A.","family":"Santana-Andreo","sequence":"additional","affiliation":[{"name":"IMSE-CNM (CSIC\/Universidad de Sevilla),Instituto de Microelectrónica de Sevilla,Sevilla,Spain,41092"}]},{"given":"J.","family":"Diaz-Fortuny","sequence":"additional","affiliation":[{"name":"imec,Leuven,Belgium,3001"}]},{"given":"R.","family":"Castro-Lopez","sequence":"additional","affiliation":[{"name":"IMSE-CNM (CSIC\/Universidad de Sevilla),Instituto de Microelectrónica de Sevilla,Sevilla,Spain,41092"}]},{"given":"E.","family":"Roca","sequence":"additional","affiliation":[{"name":"IMSE-CNM (CSIC\/Universidad de Sevilla),Instituto de Microelectrónica de Sevilla,Sevilla,Spain,41092"}]},{"given":"F. V.","family":"Fernandez","sequence":"additional","affiliation":[{"name":"IMSE-CNM (CSIC\/Universidad de Sevilla),Instituto de Microelectrónica de Sevilla,Sevilla,Spain,41092"}]}],"member":"263","reference":[{"key":"ref10","first-page":"2d-5","article-title":"Advanced MOSFET variability and reliability characterization array","author":"bury","year":"2017","journal-title":"IEEE International Reliability Physics Symposium (IRPS)"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2011.5784605"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/SMACD.2018.8434900"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2906415"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2009.5173221"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2019.111004"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2007.4419069"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2032698"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2011.5783112"},{"key":"ref19","first-page":"165","article-title":"DRV-fingerprinting: Using data retention voltage of SRAM cells for chip identification","author":"holcomb","year":"2012","journal-title":"Radio Frequency Identification: Security and Privacy Issues"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2014.2361342"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2012.06.120"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-74909-9_8"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403694"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2881923"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2020.02.002"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1149\/1.3572292"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2164543"},{"key":"ref9","first-page":"73","article-title":"Statistical assessment of the full VG\/VD degradation space using dedicated device arrays","author":"simicic","year":"2015","journal-title":"Proc IEEE Int Integra Reliab Works (IRW)"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2021.114049"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2012.6224314"}],"event":{"name":"2022 IEEE International Reliability Physics Symposium (IRPS)","location":"Dallas, TX, USA","start":{"date-parts":[[2022,3,27]]},"end":{"date-parts":[[2022,3,31]]}},"container-title":["2022 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9764406\/9764408\/09764587.pdf?arnumber=9764587","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,4]],"date-time":"2025-07-04T17:49:37Z","timestamp":1751651377000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9764587\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,3]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/irps48227.2022.9764587","relation":{},"subject":[],"published":{"date-parts":[[2022,3]]}}}