{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,11]],"date-time":"2026-02-11T13:38:50Z","timestamp":1770817130636,"version":"3.50.1"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001659","name":"Deutsche Forschungsgemeinschaft (German Research Foundation)","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001659","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001665","name":"French Agence Nationale de la Recherche (ANR) in the frame of the project \u201cD3PO\u201d","doi-asserted-by":"publisher","award":["505873959"],"award-info":[{"award-number":["505873959"]}],"id":[{"id":"10.13039\/501100001665","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,14]]},"DOI":"10.1109\/irps48228.2024.10529299","type":"proceedings-article","created":{"date-parts":[[2024,5,16]],"date-time":"2024-05-16T17:21:48Z","timestamp":1715880108000},"page":"1-10","source":"Crossref","is-referenced-by-count":8,"title":["Ferroelectric HfO2-based Capacitors for FeRAM: Reliability from Field Cycling Endurance to Retention (invited)"],"prefix":"10.1109","author":[{"given":"Pramoda","family":"Vishnumurthy","sequence":"first","affiliation":[{"name":"Noethnitzer Strasse 64a,NaMLab gGmbH,Dresden,Germany"}]},{"given":"Ruben","family":"Alcala","sequence":"additional","affiliation":[{"name":"Noethnitzer Strasse 64a,NaMLab gGmbH,Dresden,Germany"}]},{"given":"Thomas","family":"Mikolajick","sequence":"additional","affiliation":[{"name":"Noethnitzer Strasse 64a,NaMLab gGmbH,Dresden,Germany"}]},{"given":"Uwe","family":"Schroeder","sequence":"additional","affiliation":[{"name":"Noethnitzer Strasse 64a,NaMLab gGmbH,Dresden,Germany"}]},{"given":"Luis Azevedo","family":"Antunes","sequence":"additional","affiliation":[{"name":"University of Applied Sciences,Munich,Germany"}]},{"given":"Alfred","family":"Kersch","sequence":"additional","affiliation":[{"name":"University of Applied Sciences,Munich,Germany"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1063\/1.3634052"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1063\/1.4966219"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1063\/1.5050700"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1021\/acsomega.2c06237"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1103\/physrevapplied.18.064084"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1063\/1.1805190"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1126\/science.246.4936.1400"},{"key":"ref8","article-title":"Investigating charge trapping in ferroelectric thin films through transient measurements","volume-title":"Frontiers in Nanotechnology","volume":"4","author":"Lancaster","year":"2022"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.1498966"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/1.123539"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/1.1498967"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1080\/714040689"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/1.5128502"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tdmr.2004.837210"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/iedm45625.2022.10019554"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1063\/1.1654509"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.202303261"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1063\/1.4927805"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1063\/1.4866008"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/led.2019.2944960"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1002\/pssr.202100012"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1116\/6.0001491"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1002\/admi.202202151"}],"event":{"name":"2024 IEEE International Reliability Physics Symposium (IRPS)","location":"Grapevine, TX, USA","start":{"date-parts":[[2024,4,14]]},"end":{"date-parts":[[2024,4,18]]}},"container-title":["2024 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10529283\/10529298\/10529299.pdf?arnumber=10529299","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,17]],"date-time":"2024-05-17T05:11:45Z","timestamp":1715922705000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10529299\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,14]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/irps48228.2024.10529299","relation":{},"subject":[],"published":{"date-parts":[[2024,4,14]]}}}