{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,16]],"date-time":"2025-05-16T05:25:00Z","timestamp":1747373100881},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,14]]},"DOI":"10.1109\/irps48228.2024.10529310","type":"proceedings-article","created":{"date-parts":[[2024,5,16]],"date-time":"2024-05-16T17:21:48Z","timestamp":1715880108000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["Charge Trapping in SiC MOSFETs under Constant Gate Current Stress: Analysis Based on Charge Pumping Measurements"],"prefix":"10.1109","author":[{"given":"A.","family":"Marcuzzi","sequence":"first","affiliation":[{"name":"University of Padova,Department of Information Engineering,Padova,Italy,35131"}]},{"given":"M.","family":"Avramenko","sequence":"additional","affiliation":[{"name":"onsemi,Oudenaarde,Belgium,B-9700"}]},{"given":"C.","family":"De Santi","sequence":"additional","affiliation":[{"name":"University of Padova,Department of Information Engineering,Padova,Italy,35131"}]},{"given":"P.","family":"Moens","sequence":"additional","affiliation":[{"name":"onsemi,Oudenaarde,Belgium,B-9700"}]},{"given":"F.","family":"Geenen","sequence":"additional","affiliation":[{"name":"onsemi,Oudenaarde,Belgium,B-9700"}]},{"given":"G.","family":"Meneghesso","sequence":"additional","affiliation":[{"name":"University of Padova,Department of Information Engineering,Padova,Italy,35131"}]},{"given":"E.","family":"Zanoni","sequence":"additional","affiliation":[{"name":"University of Padova,Department of Information Engineering,Padova,Italy,35131"}]},{"given":"M.","family":"Meneghini","sequence":"additional","affiliation":[{"name":"University of Padova,Department of Information Engineering,Padova,Italy,35131"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/t-ed.1984.21472"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/0169-4332(87)90110-3"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1063\/5.0057285"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/jeds.2021.3091898"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ispsd49238.2022.9813614"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ispsd.2019.8757560"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/msf.527-529.935"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1063\/1.1318369"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/23.45373"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/irps46558.2021.9405196"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/1.352936"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1088\/0268-1242\/11\/2\/006"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/1.1836004"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2014.2356172"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/led.2006.883565"}],"event":{"name":"2024 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2024,4,14]]},"location":"Grapevine, TX, USA","end":{"date-parts":[[2024,4,18]]}},"container-title":["2024 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10529283\/10529298\/10529310.pdf?arnumber=10529310","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,17]],"date-time":"2024-05-17T05:11:33Z","timestamp":1715922693000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10529310\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,14]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/irps48228.2024.10529310","relation":{},"subject":[],"published":{"date-parts":[[2024,4,14]]}}}