{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,28]],"date-time":"2025-08-28T12:30:25Z","timestamp":1756384225353},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,14]]},"DOI":"10.1109\/irps48228.2024.10529313","type":"proceedings-article","created":{"date-parts":[[2024,5,16]],"date-time":"2024-05-16T17:21:48Z","timestamp":1715880108000},"page":"1-4","source":"Crossref","is-referenced-by-count":2,"title":["Measurement of Aging Effect on an Analog Computing-In-Memory Macro in 28nm CMOS"],"prefix":"10.1109","author":[{"given":"Wei-Chun","family":"Wang","sequence":"first","affiliation":[{"name":"School of ECE, Georgia Institute of Technology,Atlanta,USA"}]},{"given":"Shida","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of ECE, Georgia Institute of Technology,Atlanta,USA"}]},{"given":"Sudarshan","family":"Sharma","sequence":"additional","affiliation":[{"name":"School of ECE, Georgia Institute of Technology,Atlanta,USA"}]},{"given":"Minah","family":"Lee","sequence":"additional","affiliation":[{"name":"School of ECE, Georgia Institute of Technology,Atlanta,USA"}]},{"given":"Saibal","family":"Mukhopadhyay","sequence":"additional","affiliation":[{"name":"School of ECE, Georgia Institute of Technology,Atlanta,USA"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/esscirc59616.2023.10268706"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VLSITechnologyandCir46769.2022.9830322"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/RWS56914.2024.10438565"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IIRW59383.2023.10477704"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/irps45951.2020.9128342"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/dft59622.2023.10313545"}],"event":{"name":"2024 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2024,4,14]]},"location":"Grapevine, TX, USA","end":{"date-parts":[[2024,4,18]]}},"container-title":["2024 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10529283\/10529298\/10529313.pdf?arnumber=10529313","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,17]],"date-time":"2024-05-17T05:11:32Z","timestamp":1715922692000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10529313\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,14]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/irps48228.2024.10529313","relation":{},"subject":[],"published":{"date-parts":[[2024,4,14]]}}}