{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T01:35:25Z","timestamp":1725759325282},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key R&D Program of China","doi-asserted-by":"publisher","award":["2023YFB4402303"],"award-info":[{"award-number":["2023YFB4402303"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004731","name":"Zhejiang Provincial Natural Science Foundation","doi-asserted-by":"publisher","award":["LDQ24F040001,LZ23F040001"],"award-info":[{"award-number":["LDQ24F040001,LZ23F040001"]}],"id":[{"id":"10.13039\/501100004731","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["226-2023-00004"],"award-info":[{"award-number":["226-2023-00004"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,14]]},"DOI":"10.1109\/irps48228.2024.10529346","type":"proceedings-article","created":{"date-parts":[[2024,5,16]],"date-time":"2024-05-16T17:21:48Z","timestamp":1715880108000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Investigation of Read Disturb for Hf<sub>0.5<\/sub>Zr<sub>0.502<\/sub> Ferroelectric Field-Effect Transistors Based Neuromorphic Applications"],"prefix":"10.1109","author":[{"given":"Xinze","family":"Li","sequence":"first","affiliation":[{"name":"College of Integrated Circuits, Zhejiang University,Hangzhou,China,310000"}]},{"given":"Yiqin","family":"Zeng","sequence":"additional","affiliation":[{"name":"College of Integrated Circuits, Zhejiang University,Hangzhou,China,310000"}]},{"given":"Yuxuan","family":"Wu","sequence":"additional","affiliation":[{"name":"College of Integrated Circuits, Zhejiang University,Hangzhou,China,310000"}]},{"given":"Ying","family":"Sun","sequence":"additional","affiliation":[{"name":"College of Integrated Circuits, Zhejiang University,Hangzhou,China,310000"}]},{"given":"Junru","family":"Qu","sequence":"additional","affiliation":[{"name":"College of Integrated Circuits, Zhejiang University,Hangzhou,China,310000"}]},{"given":"Chengji","family":"Jin","sequence":"additional","affiliation":[{"name":"Research Center for Intelligent Chips, Zhejiang Lab,Hangzhou,China,311121"}]},{"given":"Jiani","family":"Gu","sequence":"additional","affiliation":[{"name":"Research Center for Intelligent Chips, Zhejiang Lab,Hangzhou,China,311121"}]},{"given":"Rongzong","family":"Shern","sequence":"additional","affiliation":[{"name":"Research Center for Intelligent Chips, Zhejiang Lab,Hangzhou,China,311121"}]},{"given":"Gaobo","family":"Lin","sequence":"additional","affiliation":[{"name":"Research Center for Intelligent Chips, Zhejiang Lab,Hangzhou,China,311121"}]},{"given":"Dawei","family":"Gao","sequence":"additional","affiliation":[{"name":"College of Integrated Circuits, Zhejiang University,Hangzhou,China,310000"}]},{"given":"Xiao","family":"Yu","sequence":"additional","affiliation":[{"name":"Research Center for Intelligent Chips, Zhejiang Lab,Hangzhou,China,311121"}]},{"given":"Bing","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Xidian University,Xi&#x0027;an,China,710071"}]},{"given":"Ran","family":"Cheng","sequence":"additional","affiliation":[{"name":"College of Integrated Circuits, Zhejiang University,Hangzhou,China,310000"}]},{"given":"Genquan","family":"Han","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Xidian University,Xi&#x0027;an,China,710071"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2016.7838397"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2022.3216819"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2023.3346030"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2022.3223183"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS48203.2023.10117810"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3109569"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-TSA51926.2021.9440073"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2023.3242922"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2007.902682"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2015.7112833"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/1.1754468"}],"event":{"name":"2024 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2024,4,14]]},"location":"Grapevine, TX, USA","end":{"date-parts":[[2024,4,18]]}},"container-title":["2024 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10529283\/10529298\/10529346.pdf?arnumber=10529346","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,17]],"date-time":"2024-05-17T05:12:02Z","timestamp":1715922722000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10529346\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,14]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/irps48228.2024.10529346","relation":{},"subject":[],"published":{"date-parts":[[2024,4,14]]}}}