{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T01:41:27Z","timestamp":1725759687179},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,14]]},"DOI":"10.1109\/irps48228.2024.10529364","type":"proceedings-article","created":{"date-parts":[[2024,5,16]],"date-time":"2024-05-16T17:21:48Z","timestamp":1715880108000},"page":"4B.3-1-4B.3-6","source":"Crossref","is-referenced-by-count":0,"title":["Robustness Assessment Through 77GHz Operating Life Test of Power Amplifier for Radar Applications in 28nm FD-SOI CMOS"],"prefix":"10.1109","author":[{"given":"F.","family":"Cacho","sequence":"first","affiliation":[{"name":"STMicroelectronics,Crolles,France,38926"}]},{"given":"P.","family":"Cathelin","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France,38926"}]},{"given":"J.","family":"Hai","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France,38926"}]},{"given":"S.","family":"Bouvot","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France,38926"}]},{"given":"J.","family":"Nowakowski","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France,38926"}]},{"given":"M.","family":"Martinez","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France,38926"}]},{"given":"R.","family":"Debroucke","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France,38926"}]},{"given":"S.","family":"Jean","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France,38926"}]},{"given":"R.","family":"Paulin","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France,38926"}]},{"given":"J.","family":"Antonijevic","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France,38926"}]},{"given":"X.","family":"Federspiel","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France,38926"}]},{"given":"N.","family":"Planes","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France,38926"}]},{"given":"G.","family":"Papotto","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Catania,Italy,95121"}]},{"given":"A.","family":"Parisi","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Catania,Italy,95121"}]},{"given":"A.","family":"Finocchiaro","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Catania,Italy,95121"}]},{"given":"A.","family":"Cavarra","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Catania,Italy,95121"}]},{"given":"A.","family":"Castorina","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Catania,Italy,95121"}]},{"given":"C.","family":"Nocera","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Catania,Italy,95121"}]},{"given":"G.","family":"Palmisano","sequence":"additional","affiliation":[{"name":"Università di Catania,DIEEI,Catania,Italy,95125"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2950184"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/EuRAD.2014.6991305"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IMBioC56839.2023.10305102"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2700359"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3050306"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/asscc.2016.7844146"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2012.2184133"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS48203.2023.10117885"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2022.3157194"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2023.3261109"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6861189"}],"event":{"name":"2024 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2024,4,14]]},"location":"Grapevine, TX, USA","end":{"date-parts":[[2024,4,18]]}},"container-title":["2024 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10529283\/10529298\/10529364.pdf?arnumber=10529364","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,17]],"date-time":"2024-05-17T17:23:43Z","timestamp":1715966623000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10529364\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,14]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/irps48228.2024.10529364","relation":{},"subject":[],"published":{"date-parts":[[2024,4,14]]}}}