{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,8]],"date-time":"2026-04-08T22:12:00Z","timestamp":1775686320029,"version":"3.50.1"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,14]]},"DOI":"10.1109\/irps48228.2024.10529375","type":"proceedings-article","created":{"date-parts":[[2024,5,16]],"date-time":"2024-05-16T17:21:48Z","timestamp":1715880108000},"page":"1-5","source":"Crossref","is-referenced-by-count":11,"title":["Data Center Silent Data Errors: Implications to Artificial Intelligence Workloads & Mitigations"],"prefix":"10.1109","author":[{"given":"B.","family":"Bittel","sequence":"first","affiliation":[{"name":"Intel Corporation,Santa Clara,CA,USA"}]},{"given":"M.","family":"Shamsa","sequence":"additional","affiliation":[{"name":"Intel Corporation,Santa Clara,CA,USA"}]},{"given":"B.","family":"Inkley","sequence":"additional","affiliation":[{"name":"Intel Corporation,Santa Clara,CA,USA"}]},{"given":"A.","family":"Gur","sequence":"additional","affiliation":[{"name":"Intel Corporation,Santa Clara,CA,USA"}]},{"given":"D.","family":"Lerner","sequence":"additional","affiliation":[{"name":"Intel Corporation,Santa Clara,CA,USA"}]},{"given":"M.","family":"Adams","sequence":"additional","affiliation":[{"name":"Intel Corporation,Santa Clara,CA,USA"}]}],"member":"263","reference":[{"key":"ref1","article-title":"Silent data corruptions at scale","volume":"abs\/2102.11245","author":"Dixit","year":"2021","journal-title":"CoRR"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/3458336.3465297"},{"key":"ref3","author":"McCarthy","year":"1955","journal-title":"A proposal for the Dartmount Summer Reasearch Project on Artificial Intelligence"},{"key":"ref4","article-title":"Evaluation of Hardware Faults on Artificial Neural Network Applications","author":"Hahira","year":"2023","journal-title":"Microelectronics Reliability"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/SBAC-PAD55451.2022.00013"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS48228.2024.10529392"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1162\/neco.1997.9.8.1735"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.48550\/ARXIV.1706.03762"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2015.2495130"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2012.2220858"},{"key":"ref12","volume-title":"LINPACK","author":"Dongarra","year":"2024"},{"key":"ref13","volume-title":"mprime","author":"Woltman","year":"2022"},{"key":"ref14","volume-title":"Accelerate Artificial Intelligence (AI) Workloads with Intel Advanced Matrix Extension (Intel AMX)","year":"2024"},{"key":"ref15","article-title":"A Software Solution for Managing Silicon Defects in Data Centers","volume-title":"IEEE Int. Test Conf.","author":"van de Ven","year":"2021"},{"key":"ref16","volume-title":"Intel \u00ae Data Center Diagnostic Tool for Intel \u00ae Xeon\u00ae Processors for Windows","year":"2024"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2011.2178387"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ITC50671.2022.00076"}],"event":{"name":"2024 IEEE International Reliability Physics Symposium (IRPS)","location":"Grapevine, TX, USA","start":{"date-parts":[[2024,4,14]]},"end":{"date-parts":[[2024,4,18]]}},"container-title":["2024 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10529283\/10529298\/10529375.pdf?arnumber=10529375","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,17]],"date-time":"2024-05-17T05:12:32Z","timestamp":1715922752000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10529375\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,14]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/irps48228.2024.10529375","relation":{},"subject":[],"published":{"date-parts":[[2024,4,14]]}}}