{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,20]],"date-time":"2026-02-20T02:19:08Z","timestamp":1771553948034,"version":"3.50.1"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62204086"],"award-info":[{"award-number":["62204086"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2020AAA0109001"],"award-info":[{"award-number":["2020AAA0109001"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,14]]},"DOI":"10.1109\/irps48228.2024.10529378","type":"proceedings-article","created":{"date-parts":[[2024,5,16]],"date-time":"2024-05-16T17:21:48Z","timestamp":1715880108000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Impact of Hot Carrier Degradation and Bias Temperature Instability on GHz Cycle-to-Cycle Variation in Ultra-Scaled FinFETs"],"prefix":"10.1109","author":[{"given":"Yiming","family":"Qu","sequence":"first","affiliation":[{"name":"School of Integrated Circuits, East China Normal University,Shanghai,China,200241"}]},{"given":"Chu","family":"Yan","sequence":"additional","affiliation":[{"name":"College of Information Science and Electronic Engineering, Zhejiang University,Hangzhou,China,310027"}]},{"given":"Yaru","family":"Ding","sequence":"additional","affiliation":[{"name":"College of Information Science and Electronic Engineering, Zhejiang University,Hangzhou,China,310027"}]},{"given":"Yi","family":"Zhao","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, East China Normal University,Shanghai,China,200241"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2015.7409677"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2015.7112706"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2019.2933729"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2014.2361342"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2013.6724745"},{"key":"ref6","first-page":"190","article-title":"Degradation of time dependent variability due to interface state generation","volume-title":"IEEE Symposium on VLSI Technology","author":"T-Luque","year":"2013"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2013.6724745"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2011.6131612"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM19574.2021.9720674"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS48203.2023.10118068"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS48203.2023.10118334"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2018.03.022"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2017.8268520"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2017.2781243"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1985.1052306"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2285245"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2022.3204429"}],"event":{"name":"2024 IEEE International Reliability Physics Symposium (IRPS)","location":"Grapevine, TX, USA","start":{"date-parts":[[2024,4,14]]},"end":{"date-parts":[[2024,4,18]]}},"container-title":["2024 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10529283\/10529298\/10529378.pdf?arnumber=10529378","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,17]],"date-time":"2024-05-17T05:12:13Z","timestamp":1715922733000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10529378\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,14]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/irps48228.2024.10529378","relation":{},"subject":[],"published":{"date-parts":[[2024,4,14]]}}}