{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T01:33:58Z","timestamp":1725759238083},"reference-count":16,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,14]]},"DOI":"10.1109\/irps48228.2024.10529382","type":"proceedings-article","created":{"date-parts":[[2024,5,16]],"date-time":"2024-05-16T17:21:48Z","timestamp":1715880108000},"page":"P67.TX-1-P67.TX-6","source":"Crossref","is-referenced-by-count":0,"title":["Design Techniques Evaluation to Mitigate RTS Noise Effect in Column ADC of 3D Stacked Image Sensors"],"prefix":"10.1109","author":[{"given":"M. Gouveia","family":"da Cunha","sequence":"first","affiliation":[{"name":"STMicroelectronics,Crolles,France,38920"}]},{"given":"S.","family":"Place","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France,38920"}]},{"given":"O.","family":"Gauthier","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France,38920"}]},{"given":"N.","family":"Virollet","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France,38920"}]},{"given":"M.","family":"Vignetti","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France,38920"}]},{"given":"P.","family":"Martin-Gonthier","sequence":"additional","affiliation":[{"name":"ISAE-SUPAERO,Toulouse,France,31400"}]},{"given":"P.","family":"Magnan","sequence":"additional","affiliation":[{"name":"ISAE-SUPAERO,Toulouse,France,31400"}]},{"given":"V.","family":"Goiffon","sequence":"additional","affiliation":[{"name":"ISAE-SUPAERO,Toulouse,France,31400"}]}],"member":"263","reference":[{"first-page":"24","volume-title":"IISW 2019","author":"Hasegawa","key":"ref1"},{"first-page":"30.4. 1","volume-title":"IEEE-IEDM 2021","author":"Nakazawa","key":"ref2"},{"first-page":"219","volume-title":"IISW 2007","author":"Leyris","key":"ref3"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"1401","DOI":"10.1016\/j.sse.2008.04.012","author":"Theuwissen","year":"2008","journal-title":"Solid-State Electronics"},{"issue":"4","key":"ref5","first-page":"388","author":"Cho","journal-title":"JSTS 2012"},{"first-page":"20190118","volume-title":"ELEX 2019","author":"Liu","key":"ref6"},{"key":"ref7","first-page":"1","volume-title":"IEEE-IEDM","author":"Wang","year":"2006"},{"journal-title":"Electronics Letters 2010","first-page":"1323","author":"Martin-Gonthier","key":"ref8"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/nems.2013.6559673"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"108320s","DOI":"10.1016\/j.sse.2022.108320","author":"Gauthier","year":"2022","journal-title":"Solid-State Electronics"},{"volume-title":"IISW 2012","author":"Goiffon","key":"ref12"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"4217","DOI":"10.1166\/jnn.2018.15239","author":"Fan","year":"2018","journal-title":"J. of NanoSc and Nanotechnology"},{"first-page":"996","volume-title":"IEEE-IRPS 2009","author":"Abe","key":"ref14"},{"first-page":"1950","volume-title":"IEEE TED 1996","author":"Triantis","key":"ref15"},{"key":"ref16","first-page":"313","volume-title":"IEEE-CAS 2008","author":"Park","year":"2008"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/etd.1995.403468"}],"event":{"name":"2024 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2024,4,14]]},"location":"Grapevine, TX, USA","end":{"date-parts":[[2024,4,18]]}},"container-title":["2024 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10529283\/10529298\/10529382.pdf?arnumber=10529382","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,17]],"date-time":"2024-05-17T05:12:40Z","timestamp":1715922760000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10529382\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,14]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/irps48228.2024.10529382","relation":{},"subject":[],"published":{"date-parts":[[2024,4,14]]}}}