{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,31]],"date-time":"2026-03-31T14:24:12Z","timestamp":1774967052962,"version":"3.50.1"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100007780","name":"Indian Institute of Science","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100007780","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100021014","name":"Department of Science and Technology","doi-asserted-by":"publisher","award":["DST\/TDT\/AMT\/2021\/005(G)"],"award-info":[{"award-number":["DST\/TDT\/AMT\/2021\/005(G)"]}],"id":[{"id":"10.13039\/100021014","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001843","name":"Science and Engineering Research Board","doi-asserted-by":"publisher","award":["CRG\/2020\/005554"],"award-info":[{"award-number":["CRG\/2020\/005554"]}],"id":[{"id":"10.13039\/501100001843","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,14]]},"DOI":"10.1109\/irps48228.2024.10529406","type":"proceedings-article","created":{"date-parts":[[2024,5,16]],"date-time":"2024-05-16T17:21:48Z","timestamp":1715880108000},"page":"1-5","source":"Crossref","is-referenced-by-count":2,"title":["On The Role of Stress Engineering of Surface Passivation in Determining the Device Performance of AlGaN\/GaN HEMTs"],"prefix":"10.1109","author":[{"given":"Mehak A.","family":"Mir","sequence":"first","affiliation":[{"name":"Indian Institute of Science,Department of Electronic Systems Engineering,Bangalore,India"}]},{"given":"A.","family":"Thakare","sequence":"additional","affiliation":[{"name":"Indian Institute of Science,Department of Electronic Systems Engineering,Bangalore,India"}]},{"given":"M. A.","family":"Munshi","sequence":"additional","affiliation":[{"name":"Indian Institute of Science,Department of Electronic Systems Engineering,Bangalore,India"}]},{"given":"V.","family":"Avinash","sequence":"additional","affiliation":[{"name":"Indian Institute of Science,Department of Electronic Systems Engineering,Bangalore,India"}]},{"given":"S.","family":"Wani","sequence":"additional","affiliation":[{"name":"Indian Institute of Science,Department of Electronic Systems Engineering,Bangalore,India"}]},{"given":"Z.","family":"Khan","sequence":"additional","affiliation":[{"name":"Indian Institute of Science,Department of Electronic Systems Engineering,Bangalore,India"}]},{"given":"R.","family":"Chaudhuri","sequence":"additional","affiliation":[{"name":"Indian Institute of Science,Department of Electronic Systems Engineering,Bangalore,India"}]},{"given":"S.","family":"Karthik","sequence":"additional","affiliation":[{"name":"Indian Institute of Science,Department of Electronic Systems Engineering,Bangalore,India"}]},{"given":"R.","family":"Malik","sequence":"additional","affiliation":[{"name":"Indian Institute of Science,Department of Electronic Systems Engineering,Bangalore,India"}]},{"given":"V.","family":"Joshi","sequence":"additional","affiliation":[{"name":"Indian Institute of Science,Department of Electronic Systems Engineering,Bangalore,India"}]},{"given":"M.","family":"Shrivastava","sequence":"additional","affiliation":[{"name":"Indian Institute of Science,Department of Electronic Systems Engineering,Bangalore,India"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ispsd.2012.6229092"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/led.2014.2304680"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2017.2706090"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/irps48203.2023.10117664"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/led.2011.2118190"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/led.2013.2274429"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2021.3064531"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/led.2012.2236638"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.7567\/APEX.8.064102"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/1.1906328"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/edtm.2019.8731108"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1002\/pssc.200461350"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/jeds.2020.3020186"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2021.3109847"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2022.3213627"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2023.3300652"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1063\/1.1868059"}],"event":{"name":"2024 IEEE International Reliability Physics Symposium (IRPS)","location":"Grapevine, TX, USA","start":{"date-parts":[[2024,4,14]]},"end":{"date-parts":[[2024,4,18]]}},"container-title":["2024 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10529283\/10529298\/10529406.pdf?arnumber=10529406","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,17]],"date-time":"2024-05-17T05:12:03Z","timestamp":1715922723000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10529406\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,14]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/irps48228.2024.10529406","relation":{},"subject":[],"published":{"date-parts":[[2024,4,14]]}}}