{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,24]],"date-time":"2025-12-24T12:21:08Z","timestamp":1766578868174,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,14]]},"DOI":"10.1109\/irps48228.2024.10529411","type":"proceedings-article","created":{"date-parts":[[2024,5,16]],"date-time":"2024-05-16T17:21:48Z","timestamp":1715880108000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["Neutron and Laser Irradiation of Si and Ge Diodes"],"prefix":"10.1109","author":[{"given":"Ricardo","family":"Asc\u00e1zubi","sequence":"first","affiliation":[{"name":"On sabbatical from Intel Corp.,Hillsboro,OR,USA,97124"}]},{"given":"F. Rogelio","family":"Palomo","sequence":"additional","affiliation":[{"name":"Escuela Técnica Superior de Inaeniería,Departamento de Ingeniería Electrónica"}]},{"given":"Jose Manuel","family":"Quesada","sequence":"additional","affiliation":[{"name":"Molecular y Nuclear, Universidad de Sevilla,Departamento de Física Atómica,Sevilla,Spain,E-41080"}]},{"given":"Miguel Antonio","family":"Cort\u00e9s-Giraldo","sequence":"additional","affiliation":[{"name":"Molecular y Nuclear, Universidad de Sevilla,Departamento de Física Atómica,Sevilla,Spain,E-41080"}]},{"given":"Jose Antonio","family":"Pav\u00f3n","sequence":"additional","affiliation":[{"name":"Molecular y Nuclear, Universidad de Sevilla,Departamento de Física Atómica,Sevilla,Spain,E-41080"}]}],"member":"263","reference":[{"issue":"1","key":"ref1","doi-asserted-by":"crossref","first-page":"21","DOI":"10.1109\/TNS.2020.3033590","volume":"68","author":"de Boissac","year":"2020","journal-title":"IEEE Trans. Nuc. Sci."},{"issue":"3","key":"ref2","doi-asserted-by":"crossref","first-page":"30","DOI":"10.1109\/MSPEC.2016.7420396","volume":"53","author":"Geist","year":"2016","journal-title":"IEEE Spectrum"},{"key":"ref3","first-page":"1","author":"Ajdari","year":"2020","journal-title":"2020 IEEE IRPS. IEEE"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/radecs53308.2021.9954466"},{"issue":"2","key":"ref5","doi-asserted-by":"crossref","first-page":"27","DOI":"10.1140\/epja\/i2013-13027-6","volume":"49","author":"Guerrero","year":"2013","journal-title":"Eur. Phys. Jrnl A"},{"issue":"3","key":"ref6","doi-asserted-by":"crossref","DOI":"10.3390\/jimaging4030047","volume":"4","author":"Kockelmann","year":"2018","journal-title":"Journal of Imaging"},{"key":"ref7","first-page":"323","volume-title":"Proc. 14th Int. Conf. Nuclear Reaction Mechanisms June 15\u201319, 2015","author":"Gunsing","year":"2015"},{"volume-title":"Si Photodiodes S1336 series","year":"2015","key":"ref8"},{"volume-title":"Ge Photodiode FDG03","year":"2018","key":"ref9"},{"volume-title":"LTC6268\/LTC6269 500MHz Ultra-Low Bias Current FET Input Op Amp","year":"2014","key":"ref10"},{"issue":"12","key":"ref11","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1140\/epja\/i2015-15160-6","volume":"51","author":"Lo Meo","year":"2015","journal-title":"The European Physical Journal A"},{"issue":"3","key":"ref12","doi-asserted-by":"crossref","first-page":"305","DOI":"10.1109\/TDMR.2005.853449","volume":"5","author":"Baumann","year":"2005","journal-title":"IEEE Tran.Dev.Mat. Rel."},{"journal-title":"JEDEC Solid State Technology Association, Arlington, VA, Standard","article-title":"JESD89B","year":"2021","key":"ref13"}],"event":{"name":"2024 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2024,4,14]]},"location":"Grapevine, TX, USA","end":{"date-parts":[[2024,4,18]]}},"container-title":["2024 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10529283\/10529298\/10529411.pdf?arnumber=10529411","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,17]],"date-time":"2024-05-17T05:13:16Z","timestamp":1715922796000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10529411\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,14]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/irps48228.2024.10529411","relation":{},"subject":[],"published":{"date-parts":[[2024,4,14]]}}}