{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,16]],"date-time":"2025-05-16T05:49:01Z","timestamp":1747374541316},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,14]]},"DOI":"10.1109\/irps48228.2024.10529418","type":"proceedings-article","created":{"date-parts":[[2024,5,16]],"date-time":"2024-05-16T17:21:48Z","timestamp":1715880108000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Missing Trigger Circuit Action and Device Engineering for Conventional Nanoscale SCR"],"prefix":"10.1109","author":[{"given":"Mitesh","family":"Goyal","sequence":"first","affiliation":[{"name":"Indian Institute of Science,Department of ESE,Bangalore,India"}]},{"given":"Mukesh","family":"Chaturvedi","sequence":"additional","affiliation":[{"name":"Indian Institute of Science,Department of ESE,Bangalore,India"}]},{"given":"Raju","family":"Kumar","sequence":"additional","affiliation":[{"name":"Indian Institute of Science,Department of ESE,Bangalore,India"}]},{"given":"Mahesh","family":"Vaidya","sequence":"additional","affiliation":[{"name":"Indian Institute of Science,Department of ESE,Bangalore,India"}]},{"given":"Mayank","family":"Shrivastava","sequence":"additional","affiliation":[{"name":"Indian Institute of Science,Department of ESE,Bangalore,India"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/0470846054"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tdmr.2005.846824"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/irps48203.2023.10118266"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2009.2021359"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/icsict.2014.7021539"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2016.7574555"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/edssc.2007.4450166"},{"volume-title":"High Current TLP Characterisation: An Effective Tool for the Development of Semiconductor Devices and ESD Protection Solutions","year":"2012","author":"Werner","key":"ref8"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/led.2012.2208934"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/SOC.2003.1241496"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tdmr.2003.815192"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2009.2019164"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/iedm.1998.746288"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/irps.2019.8720580"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/55.915608"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/led.2013.2252456"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tdmr.2015.2466532"}],"event":{"name":"2024 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2024,4,14]]},"location":"Grapevine, TX, USA","end":{"date-parts":[[2024,4,18]]}},"container-title":["2024 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10529283\/10529298\/10529418.pdf?arnumber=10529418","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,17]],"date-time":"2024-05-17T05:12:44Z","timestamp":1715922764000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10529418\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,14]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/irps48228.2024.10529418","relation":{},"subject":[],"published":{"date-parts":[[2024,4,14]]}}}