{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,27]],"date-time":"2026-05-27T18:16:08Z","timestamp":1779905768462,"version":"3.53.1"},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004020","name":"Japan Aerospace Exploration Agency","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004020","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,14]]},"DOI":"10.1109\/irps48228.2024.10529442","type":"proceedings-article","created":{"date-parts":[[2024,5,16]],"date-time":"2024-05-16T17:21:48Z","timestamp":1715880108000},"page":"1-4","source":"Crossref","is-referenced-by-count":3,"title":["An SEU Cross Section Model Reproducing LET and Voltage Dependence in Bulk Planar and FinFET SRAMs"],"prefix":"10.1109","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8541-7491","authenticated-orcid":false,"given":"Kozo","family":"Takeuchi","sequence":"first","affiliation":[{"name":"Kyoto University,Department of Informatics,Kyoto,Japan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3179-5315","authenticated-orcid":false,"given":"Takashi","family":"Kato","sequence":"additional","affiliation":[{"name":"Socionext Inc.,Reliability Engineering Department,Kawasaki,Japan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0377-2108","authenticated-orcid":false,"given":"Masanori","family":"Hashimoto","sequence":"additional","affiliation":[{"name":"Kyoto University,Department of Informatics,Kyoto,Japan"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/23.211340"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2021.3129185"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2022.3188993"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2023.3295340"},{"key":"ref5","volume-title":"SRIM- The Stopping and Range of Ions in Matter","author":"Ziegler","year":"2013"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tns.2021.3072328"}],"event":{"name":"2024 IEEE International Reliability Physics Symposium (IRPS)","location":"Grapevine, TX, USA","start":{"date-parts":[[2024,4,14]]},"end":{"date-parts":[[2024,4,18]]}},"container-title":["2024 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10529283\/10529298\/10529442.pdf?arnumber=10529442","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,17]],"date-time":"2024-05-17T05:13:09Z","timestamp":1715922789000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10529442\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,14]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/irps48228.2024.10529442","relation":{},"subject":[],"published":{"date-parts":[[2024,4,14]]}}}