{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,21]],"date-time":"2025-08-21T17:29:58Z","timestamp":1755797398936,"version":"3.44.0"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,14]]},"DOI":"10.1109\/irps48228.2024.10529462","type":"proceedings-article","created":{"date-parts":[[2024,5,16]],"date-time":"2024-05-16T13:21:48Z","timestamp":1715865708000},"page":"4B.2-1-4B.2-6","source":"Crossref","is-referenced-by-count":1,"title":["A Methodology to Address RF Aging of 40nm CMOS PA Cells Under 5G mmW Modulation Profiles"],"prefix":"10.1109","author":[{"given":"A.","family":"Divay","sequence":"first","affiliation":[{"name":"CEA-LETI, Université Grenoble Alpes,Grenoble,France,F-38000"}]},{"given":"C.","family":"Dehos","sequence":"additional","affiliation":[{"name":"CEA-LETI, Université Grenoble Alpes,Grenoble,France,F-38000"}]},{"given":"I.","family":"Charlet","sequence":"additional","affiliation":[{"name":"CEA-LETI, Université Grenoble Alpes,Grenoble,France,F-38000"}]},{"given":"F.","family":"Gaillard","sequence":"additional","affiliation":[{"name":"CEA-LETI, Université Grenoble Alpes,Grenoble,France,F-38000"}]},{"given":"B.","family":"Duriez","sequence":"additional","affiliation":[{"name":"CEA-LETI, Université Grenoble Alpes,Grenoble,France,F-38000"}]},{"given":"X.","family":"Garros","sequence":"additional","affiliation":[{"name":"CEA-LETI, Université Grenoble Alpes,Grenoble,France,F-38000"}]},{"given":"J.","family":"Antonijevic","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France"}]},{"given":"J.","family":"Hai","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France"}]},{"given":"N.","family":"Revil","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France"}]},{"given":"J.","family":"Forest","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France"}]},{"given":"V.","family":"Knopik","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France"}]},{"given":"F.","family":"Cacho","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France"}]},{"given":"D.","family":"Roy","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France"}]},{"given":"X.","family":"Federspiel","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France"}]},{"given":"S.","family":"Cr\u00e9mer","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France"}]},{"given":"P.","family":"Chevalier","sequence":"additional","affiliation":[{"name":"STMicroelectronics,Crolles,France"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/iedm13553.2020.9371954"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/asicon.2017.8252651"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/irps48227.2022.9764477"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/irps48227.2022.9764535"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/irps45951.2020.9129588"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/iedm19573.2019.8993649"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/iedm19574.2021.9720531"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tdmr.2019.2914362"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/irps48203.2023.10117885"}],"event":{"name":"2024 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2024,4,14]]},"location":"Grapevine, TX, USA","end":{"date-parts":[[2024,4,18]]}},"container-title":["2024 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10529283\/10529298\/10529462.pdf?arnumber=10529462","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,18]],"date-time":"2025-08-18T19:32:25Z","timestamp":1755545545000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10529462\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,14]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/irps48228.2024.10529462","relation":{},"subject":[],"published":{"date-parts":[[2024,4,14]]}}}