{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,24]],"date-time":"2025-12-24T12:21:03Z","timestamp":1766578863466},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,14]]},"DOI":"10.1109\/irps48228.2024.10529467","type":"proceedings-article","created":{"date-parts":[[2024,5,16]],"date-time":"2024-05-16T17:21:48Z","timestamp":1715880108000},"page":"10C.2-1-10C.2-4","source":"Crossref","is-referenced-by-count":1,"title":["Scaling Trends and Bias Dependence of SRAM SER from 16-nm to 3-nm FinFET"],"prefix":"10.1109","author":[{"given":"B.","family":"Narasimham","sequence":"first","affiliation":[{"name":"Broadcom Inc,Irvine,CA,USA"}]},{"given":"A. R.","family":"Montoya","sequence":"additional","affiliation":[{"name":"Broadcom Inc,Irvine,CA,USA"}]},{"given":"C.","family":"Paone","sequence":"additional","affiliation":[{"name":"Broadcom Inc,Irvine,CA,USA"}]},{"given":"T.","family":"Riehle","sequence":"additional","affiliation":[{"name":"Broadcom Inc,Irvine,CA,USA"}]},{"given":"M.","family":"Smith","sequence":"additional","affiliation":[{"name":"Broadcom Inc,Irvine,CA,USA"}]},{"given":"L.","family":"Tsau","sequence":"additional","affiliation":[{"name":"Broadcom Inc,Irvine,CA,USA"}]},{"given":"D.","family":"Ball","sequence":"additional","affiliation":[{"name":"Vanderbilt University,Nashville,TN,USA"}]},{"given":"B.","family":"Bhuva","sequence":"additional","affiliation":[{"name":"Vanderbilt University,Nashville,TN,USA"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2012.2218128"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2015.2498927"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS46558.2021.9405216"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2014.6757416"},{"key":"ref5","article-title":"SEU and SEL measurements using 14-MeV and thermal neutron beams","author":"Infantino","year":"2018","journal-title":"CERNACC-2018\u20130047"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2017.2660583"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2241078"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/23.903813"},{"volume-title":"Synopsys TCAD Tools","year":"2013","key":"ref9"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/c2013-0-06812-0"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2895057"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2015.2464706"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/EDTM53872.2022.9798277"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS48203.2023.10118025"}],"event":{"name":"2024 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2024,4,14]]},"location":"Grapevine, TX, USA","end":{"date-parts":[[2024,4,18]]}},"container-title":["2024 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10529283\/10529298\/10529467.pdf?arnumber=10529467","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,17]],"date-time":"2024-05-17T04:56:05Z","timestamp":1715921765000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10529467\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,14]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/irps48228.2024.10529467","relation":{},"subject":[],"published":{"date-parts":[[2024,4,14]]}}}