{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,4]],"date-time":"2026-03-04T17:29:40Z","timestamp":1772645380408,"version":"3.50.1"},"reference-count":27,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000006","name":"ONR","doi-asserted-by":"publisher","award":["N00014-23-1-2479"],"award-info":[{"award-number":["N00014-23-1-2479"]}],"id":[{"id":"10.13039\/100000006","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,14]]},"DOI":"10.1109\/irps48228.2024.10529479","type":"proceedings-article","created":{"date-parts":[[2024,5,16]],"date-time":"2024-05-16T17:21:48Z","timestamp":1715880108000},"page":"5B.2-1-5B.2-8","source":"Crossref","is-referenced-by-count":2,"title":["Deep Level Effects in N-Polar AlGaN\/GaN High Electron Mobility Transistors: Toward Zero Dispersion Effects"],"prefix":"10.1109","author":[{"given":"Marco","family":"Saro","sequence":"first","affiliation":[{"name":"University of Padova,Department of Information Engineering,Padova,Italy"}]},{"given":"Francesco","family":"de Pieri","sequence":"additional","affiliation":[{"name":"University of Padova,Department of Information Engineering,Padova,Italy"}]},{"given":"Andrea","family":"Carlotto","sequence":"additional","affiliation":[{"name":"University of Padova,Department of Information Engineering,Padova,Italy"}]},{"given":"Mirko","family":"Fornasier","sequence":"additional","affiliation":[{"name":"University of Padova,Department of Information Engineering,Padova,Italy"}]},{"given":"Fabiana","family":"Rampazzo","sequence":"additional","affiliation":[{"name":"University of Padova,Department of Information Engineering,Padova,Italy"}]},{"given":"Carlo","family":"De Santi","sequence":"additional","affiliation":[{"name":"University of Padova,Department of Information Engineering,Padova,Italy"}]},{"given":"Gaudenzio","family":"Meneghesso","sequence":"additional","affiliation":[{"name":"University of Padova,Department of Information Engineering,Padova,Italy"}]},{"given":"Matteo","family":"Meneghini","sequence":"additional","affiliation":[{"name":"University of Padova,Department of Information Engineering,Padova,Italy"}]},{"given":"Enrico","family":"Zanoni","sequence":"additional","affiliation":[{"name":"University of Padova,Department of Information Engineering,Padova,Italy"}]},{"given":"Davide","family":"Bisi","sequence":"additional","affiliation":[{"name":"Transphorm Inc.,Goleta,CA,USA,93117"}]},{"given":"Matthew","family":"Guidry","sequence":"additional","affiliation":[{"name":"University of Padova,Department of Information Engineering,Padova,Italy"}]},{"given":"Stacia","family":"Keller","sequence":"additional","affiliation":[{"name":"University of California Santa Barbara,Department of Electrical and Computer Engineering,Santa Barbara,USA"}]},{"given":"Umesh","family":"Mishra","sequence":"additional","affiliation":[{"name":"University of California Santa Barbara,Department of Electrical and Computer Engineering,Santa Barbara,USA"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2017.2770087"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1063\/1.2820381"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/led.2012.2196973"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/iedm45625.2022.10019475"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/0268-1242\/28\/7\/074009"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0268-1242\/29\/11\/113001"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/bs.semsem.2019.08.012"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/wipda49284.2021.9645102"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/5.0019222"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/1.1490396"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/led.2020.2968875"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/irps46558.2021.9405111"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2013.2279021"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2013.2278290"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6861130"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1088\/0268-1242\/31\/9\/093004"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/S0022-0248(00)00982-9"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/41\/15\/155314"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1063\/1.1586981"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1063\/1.2830860"},{"key":"ref21","doi-asserted-by":"crossref","DOI":"10.1063\/1.125622","volume-title":"Electrical characterization of isoelectronic In-doping effects in GaN films grown by metalorganic vapor phase epitaxy","author":"Chung","year":"2000"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1063\/1.4927405"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.7567\/jjap.52.04cf07"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1063\/1.2137901"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/irps.2012.6241883"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/led.2010.2047092"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2021.114255"}],"event":{"name":"2024 IEEE International Reliability Physics Symposium (IRPS)","location":"Grapevine, TX, USA","start":{"date-parts":[[2024,4,14]]},"end":{"date-parts":[[2024,4,18]]}},"container-title":["2024 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10529283\/10529298\/10529479.pdf?arnumber=10529479","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,17]],"date-time":"2024-05-17T05:13:24Z","timestamp":1715922804000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10529479\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,14]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/irps48228.2024.10529479","relation":{},"subject":[],"published":{"date-parts":[[2024,4,14]]}}}