{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,30]],"date-time":"2025-09-30T10:51:58Z","timestamp":1759229518019},"reference-count":7,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,14]],"date-time":"2024-04-14T00:00:00Z","timestamp":1713052800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,4,14]]},"DOI":"10.1109\/irps48228.2024.10529490","type":"proceedings-article","created":{"date-parts":[[2024,5,16]],"date-time":"2024-05-16T17:21:48Z","timestamp":1715880108000},"page":"P68.TX-1-P68.TX-5","source":"Crossref","is-referenced-by-count":1,"title":["A Novel Quantitative Model for Combination Effects of Hydrogen and Process Heat on Peripheral Transistors in 3D-NAND Flash Memory"],"prefix":"10.1109","author":[{"given":"Dongjin","family":"Lee","sequence":"first","affiliation":[{"name":"Samsung Electronics,FLASH Technology Development, Semiconductor Research Center,Giheung,South Korea,17113"}]},{"given":"Yunjo","family":"Lee","sequence":"additional","affiliation":[{"name":"Samsung Electronics,FLASH Technology Development, Semiconductor Research Center,Giheung,South Korea,17113"}]},{"given":"Soyeong","family":"Na","sequence":"additional","affiliation":[{"name":"Samsung Electronics,FLASH Technology Development, Semiconductor Research Center,Giheung,South Korea,17113"}]},{"given":"KangOh","family":"Yun","sequence":"additional","affiliation":[{"name":"Samsung Electronics,FLASH Technology Development, Semiconductor Research Center,Giheung,South Korea,17113"}]},{"given":"Sungkweon","family":"Baek","sequence":"additional","affiliation":[{"name":"Samsung Electronics,FLASH Technology Development, Semiconductor Research Center,Giheung,South Korea,17113"}]},{"given":"Jaeduk","family":"Lee","sequence":"additional","affiliation":[{"name":"Samsung Electronics,FLASH Technology Development, Semiconductor Research Center,Giheung,South Korea,17113"}]},{"given":"Jaehoon","family":"Jang","sequence":"additional","affiliation":[{"name":"Samsung Electronics,FLASH Technology Development, Semiconductor Research Center,Giheung,South Korea,17113"}]},{"given":"Jaihyuk","family":"Song","sequence":"additional","affiliation":[{"name":"Samsung Electronics,FLASH Technology Development, Semiconductor Research Center,Giheung,South Korea,17113"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/16.57135"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/S0022-3093(98)00851-5"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1995.497188"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/16.485536"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/EDTM50988.2021.9420842"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/edl.1985.26157"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/0166-1280(87)80008-8"}],"event":{"name":"2024 IEEE International Reliability Physics Symposium (IRPS)","start":{"date-parts":[[2024,4,14]]},"location":"Grapevine, TX, USA","end":{"date-parts":[[2024,4,18]]}},"container-title":["2024 IEEE International Reliability Physics Symposium (IRPS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10529283\/10529298\/10529490.pdf?arnumber=10529490","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,17]],"date-time":"2024-05-17T17:23:41Z","timestamp":1715966621000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10529490\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4,14]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/irps48228.2024.10529490","relation":{},"subject":[],"published":{"date-parts":[[2024,4,14]]}}}