{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T06:58:06Z","timestamp":1730271486230,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,10,12]],"date-time":"2022-10-12T00:00:00Z","timestamp":1665532800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,10,12]],"date-time":"2022-10-12T00:00:00Z","timestamp":1665532800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,10,12]]},"DOI":"10.1109\/is57118.2022.10019667","type":"proceedings-article","created":{"date-parts":[[2023,1,25]],"date-time":"2023-01-25T18:48:51Z","timestamp":1674672531000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Automatic characterization of MEMS electronic filters"],"prefix":"10.1109","author":[{"given":"Natalia","family":"Wasilewska","sequence":"first","affiliation":[{"name":"Laboratory of Metrology,Railway Research Institute,Warsaw,Poland"}]},{"given":"Michal","family":"Nowicki","sequence":"additional","affiliation":[{"name":"Warsaw University of Technology,Institute of Metrology and Biomedical Engineering,Warsaw,Poland"}]},{"given":"Roman","family":"Szewczyk","sequence":"additional","affiliation":[{"name":"ŁUKASIEWICZ Research Network - Industrial Research Institute for Automation and Measurements PIAP,Warsaw,Poland"}]},{"given":"Pawel","family":"Nowak","sequence":"additional","affiliation":[{"name":"Warsaw University of Technology,Institute of Metrology and Biomedical Engineering,Warsaw,Poland"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-32-9852-1"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2514180"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1017\/cbo9781139005227"},{"year":"2013","key":"ref4","article-title":"Evaluation of the Uncertainty of Measurement In Calibration"},{"volume-title":"LabVIEW environment in a computer-aided experiment","year":"2017","author":"T\u0142acza","key":"ref5"},{"journal-title":"Siglent SDG1000 Datasheet","key":"ref6"},{"key":"ref7","first-page":"1","article-title":"G104-A2LA Guide for estimation of measurement uncertainty in testing","volume":"10","author":"Adams","year":"2002","journal-title":"American Association of Laboratory Accreditation Manual"},{"journal-title":"3575A Operating & Service Manual","key":"ref8"},{"key":"ref9","article-title":"ILAC Policy for Measurement Uncertainty in Calibration","volume":"2020","year":"2020","journal-title":"International Laboratory Accreditation Cooperation"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.4236\/cs.2014.59023"},{"volume":"2008","journal-title":"Evaluation of measurement data - Guide to the expression of uncertainty in measurement","year":"2008","key":"ref11"}],"event":{"name":"2022 IEEE 11th International Conference on Intelligent Systems (IS)","start":{"date-parts":[[2022,10,12]]},"location":"Warsaw, Poland","end":{"date-parts":[[2022,10,14]]}},"container-title":["2022 IEEE 11th International Conference on Intelligent Systems (IS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10019601\/10019606\/10019667.pdf?arnumber=10019667","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,13]],"date-time":"2024-02-13T07:37:29Z","timestamp":1707809849000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10019667\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,10,12]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/is57118.2022.10019667","relation":{},"subject":[],"published":{"date-parts":[[2022,10,12]]}}}