{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T10:14:07Z","timestamp":1729678447283,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,3,28]],"date-time":"2022-03-28T00:00:00Z","timestamp":1648425600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,3,28]],"date-time":"2022-03-28T00:00:00Z","timestamp":1648425600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,3,28]]},"DOI":"10.1109\/isbi52829.2022.9761682","type":"proceedings-article","created":{"date-parts":[[2022,4,26]],"date-time":"2022-04-26T19:39:34Z","timestamp":1651001974000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Improved Histology Image Classification under Label Noise Via Feature Aggregating Memory Banks"],"prefix":"10.1109","author":[{"given":"Nikhil Cherian","family":"Kurian","sequence":"first","affiliation":[{"name":"IIT Bombay,Department of Electrical Engineering,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S","family":"Varsha","sequence":"additional","affiliation":[{"name":"IIT Bombay,Department of Electrical Engineering,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Akshay","family":"Bajpai","sequence":"additional","affiliation":[{"name":"IIT Bombay,Department of Electrical Engineering,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sunil","family":"Patel","sequence":"additional","affiliation":[{"name":"Nvidia Corporation,Mumbai,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Amit","family":"Sethi","sequence":"additional","affiliation":[{"name":"IIT Bombay,Department of Electrical Engineering,India"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.00674"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/EMBC46164.2021.9630477"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW53098.2021.00304"},{"article-title":"Self supervised contrastive learning for digital histopathology","year":"2020","author":"ciga","key":"ref13"},{"key":"ref14","article-title":"Pytorch metric learning","author":"musgrave","year":"2020","journal-title":"CoRR"},{"key":"ref4","doi-asserted-by":"crossref","DOI":"10.1609\/aaai.v31i1.10894","article-title":"Robust loss functions under label noise for deep neural networks","volume":"31","author":"ghosh","year":"2017","journal-title":"Proceedings of the AAAI Conference on Artificial Intelligence"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISBI48211.2021.9434169"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00906"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.240"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.media.2019.05.010"},{"article-title":"Open-set label noise can improve robustness against inherent label noise","year":"2021","author":"wei","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1111\/j.1365-2559.1994.tb01567.x"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/widm.1410"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/WACV48630.2021.00365"}],"event":{"name":"2022 IEEE 19th International Symposium on Biomedical Imaging (ISBI)","start":{"date-parts":[[2022,3,28]]},"location":"Kolkata, India","end":{"date-parts":[[2022,3,31]]}},"container-title":["2022 IEEE 19th International Symposium on Biomedical Imaging (ISBI)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9761376\/9761399\/09761682.pdf?arnumber=9761682","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,2,3]],"date-time":"2023-02-03T16:30:36Z","timestamp":1675441836000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9761682\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,3,28]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/isbi52829.2022.9761682","relation":{},"subject":[],"published":{"date-parts":[[2022,3,28]]}}}