{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,18]],"date-time":"2025-11-18T12:14:46Z","timestamp":1763468086927,"version":"3.41.0"},"reference-count":30,"publisher":"IEEE","license":[{"start":{"date-parts":[[2012,6,1]],"date-time":"2012-06-01T00:00:00Z","timestamp":1338508800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2012,6,1]],"date-time":"2012-06-01T00:00:00Z","timestamp":1338508800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,6]]},"DOI":"10.1109\/isca.2012.6237029","type":"proceedings-article","created":{"date-parts":[[2012,7,21]],"date-time":"2012-07-21T00:59:02Z","timestamp":1342832342000},"page":"333-343","source":"Crossref","is-referenced-by-count":11,"title":["Setting an error detection infrastructure with low cost acoustic wave detectors"],"prefix":"10.1109","author":[{"given":"Gaurang","family":"Upasani","sequence":"first","affiliation":[{"name":"Dept. d'Arquitectura de Computadors, Universitat Politècnica de Catalunya, Barcelona, Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xavier","family":"Vera","sequence":"additional","affiliation":[{"name":"Intel Barcelona Research Center, Intel Labs, Barcelona, Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Antonio","family":"Gonz\u00e1lez","sequence":"additional","affiliation":[{"name":"Dept. d'Arquitectura de Computadors, Universitat Politècnica de Catalunya, Barcelona, Spain"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.1999.809458"},{"article-title":"Silicon amnesia: a tutorial on radiation induced soft errors","volume-title":"International Reliability Physics Symposium (IRPS)","author":"Baumann","key":"ref2"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/7298.946456"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2005.69"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/9780470544228"},{"volume-title":"Intel\u2018s Nehalem data sheet","author":"Corporation","key":"ref6"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.70.214307"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2011.5784522"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.1976.308294"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/NSSMIC.1998.774294"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/S0168-9002(98)00957-7"},{"key":"ref12","first-page":"17","article-title":"Cosmic ray detectors for integrated circuit chips","volume-title":"United States Patent Number","author":"Hannah","year":"2007"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.2197\/ipsjdc.2.748"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2007.19"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/1013235.1013273"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2003.1269335"},{"key":"ref17","article-title":"Characterizing rifle performance using circular error probable measured via a flatbed scanner","author":"McMillan","year":"2008","journal-title":"Creative Commons Attribution-Noncommercial-No Derivative Works"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/b978-0-12-369529-1.x5001-0"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/prdc.2004.1276550"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/545214.545227"},{"volume-title":"Proceedings of International Symposium on Microarchitecture (MICRO)","key":"ref21","article-title":"C.P. Two-dimensional parity checking"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/355984.355989"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/CGO.2005.34"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2005.21"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1999.781037"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/24.52622"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2006.251220"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/WPNC.2008.4510359"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/378993.379247"},{"volume-title":"Capacitance bar sensor","year":"1990","author":"William","key":"ref30"}],"event":{"name":"2012 ACM\/IEEE 39th International Symposium on Computer Architecture (ISCA)","start":{"date-parts":[[2012,6,9]]},"location":"Portland, OR, USA","end":{"date-parts":[[2012,6,13]]}},"container-title":["2012 39th Annual International Symposium on Computer Architecture (ISCA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6230820\/6236993\/06237029.pdf?arnumber=6237029","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T05:41:06Z","timestamp":1747806066000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6237029\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,6]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/isca.2012.6237029","relation":{},"subject":[],"published":{"date-parts":[[2012,6]]}}}