{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,25]],"date-time":"2025-10-25T18:50:13Z","timestamp":1761418213617,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/iscas.2002.1009798","type":"proceedings-article","created":{"date-parts":[[2003,6,25]],"date-time":"2003-06-25T20:42:54Z","timestamp":1056573774000},"page":"I-145-I-148","source":"Crossref","is-referenced-by-count":2,"title":["A substrate noise circuit for accurately testing mixed-signal ICs"],"prefix":"10.1109","volume":"1","author":[{"family":"Weize Xu","sequence":"first","affiliation":[]},{"given":"E.G.","family":"Friedman","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"433","article-title":"Effect of Substrate Material on Crosstalk in Mixed AnalogIDigital Integrated Circuits","author":"merrill","year":"1994","journal-title":"Proceedings of the IEEE International Electron Devices Meeting"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/4.278344"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008255029409"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/4.509856"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1023\/A:1011204026940"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/4.210024"},{"key":"ref7","first-page":"575","article-title":"Measurements and Analysis of Substrate Noise Waveform in Mixed-Signal Ie Environment","author":"nagata","year":"1999","journal-title":"Proceedings of the IEEE Custom Integrated Circuits Conference"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.1992.229245"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/4.848209"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"451","DOI":"10.1109\/T-ED.1982.20722","article-title":"noise spikes in digital vlsi circuits","volume":"29","author":"wallmark","year":"1982","journal-title":"IEEE Transactions on Electron Devices"}],"event":{"name":"2002 IEEE International Symposium on Circuits and Systems","acronym":"ISCAS-02","location":"Phoenix-Scottsdale, AZ, USA"},"container-title":["2002 IEEE International Symposium on Circuits and Systems. Proceedings (Cat. No.02CH37353)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/7897\/21766\/01009798.pdf?arnumber=1009798","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,15]],"date-time":"2017-06-15T22:39:34Z","timestamp":1497566374000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1009798\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/iscas.2002.1009798","relation":{},"subject":[]}}