{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T07:52:54Z","timestamp":1729669974195,"version":"3.28.0"},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/iscas.2003.1206152","type":"proceedings-article","created":{"date-parts":[[2003,11,4]],"date-time":"2003-11-04T23:56:54Z","timestamp":1067990214000},"page":"IV-596-IV-599","source":"Crossref","is-referenced-by-count":0,"title":["1\/f noise modeling using discrete-time self-similar systems"],"prefix":"10.1109","volume":"4","author":[{"given":"R.","family":"Narasimha","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.B.","family":"Rachaiah","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.M.","family":"Rao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.R.","family":"Mukund","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1557\/PROC-557-869"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1966.4630"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1967.1053992"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.1998.681746"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1117\/12.458730"},{"article-title":"Statistics for Long-Memory Processes","year":"1994","author":"beran","key":"ref15"},{"article-title":"Table of Integrals, Series, and Products","year":"1994","author":"gradshteyn","key":"ref16"},{"year":"0","key":"ref17"},{"key":"ref18","article-title":"Discrete-Time Models for Statistically Self-Similar Signals","author":"lee","year":"2003","journal-title":"IEEE Trans on Signal Processing"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.2001.928650"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/S0038-1101(98)00162-2"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/55.817447"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/16.47770"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/16.824724"},{"key":"ref7","doi-asserted-by":"crossref","DOI":"10.1117\/12.385433","article-title":"Analysis of 1\/f noise in CMOS APS","volume":"3965","author":"tian","year":"2000","journal-title":"Proceedings of SPIE Electronic Imaging"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/16.918240"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1982.12282"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1557\/PROC-507-175"}],"event":{"name":"ISCAS 2003. International Symposium on Circuits and Systems","acronym":"ISCAS-03","location":"Bangkok, Thailand"},"container-title":["Proceedings of the 2003 International Symposium on Circuits and Systems, 2003. ISCAS '03."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8570\/27140\/01206152.pdf?arnumber=1206152","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T01:57:30Z","timestamp":1497578250000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1206152\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/iscas.2003.1206152","relation":{},"subject":[]}}