{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T06:30:22Z","timestamp":1725431422376},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/iscas.2005.1464809","type":"proceedings-article","created":{"date-parts":[[2005,7,27]],"date-time":"2005-07-27T13:52:28Z","timestamp":1122472348000},"page":"1202-1205","source":"Crossref","is-referenced-by-count":2,"title":["On-Chip ESD Protection for RF I\/Os: Devices, Circuits and Models"],"prefix":"10.1109","author":[{"given":"E.","family":"Rosenbaum","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Hyvonen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2003.1249398"},{"year":"0","author":"hyv\ufffdnen","key":"11"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2714(03)00130-6"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9781139166980"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2005.850688"},{"journal-title":"The Design of CMOS Radio-Frequency Integrated Circuits","year":"2004","author":"lee","key":"1"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1049\/el:20030221"},{"journal-title":"ESD in Silicon Integrated Circuits","year":"1995","author":"amerasekera","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/EOSESD.2004.5272602"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1016\/S0304-3886(03)00065-2"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/EOSESD.2000.890084"},{"key":"9","first-page":"2","article-title":"comprehensive frequency-dependent substrate noise analysis using boundary element methods","author":"li","year":"2002","journal-title":"Proc ICCAD"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/6104.930960"}],"event":{"name":"2005 IEEE International Symposium on Circuits and Systems","location":"Kobe, Japan"},"container-title":["2005 IEEE International Symposium on Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9898\/31469\/01464809.pdf?arnumber=1464809","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,10,14]],"date-time":"2020-10-14T12:02:54Z","timestamp":1602676974000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/1464809"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/iscas.2005.1464809","relation":{},"subject":[]}}