{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T05:25:41Z","timestamp":1725427541032},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/iscas.2005.1465254","type":"proceedings-article","created":{"date-parts":[[2005,7,27]],"date-time":"2005-07-27T13:52:28Z","timestamp":1122472348000},"page":"2983-2986","source":"Crossref","is-referenced-by-count":3,"title":["An Embedded Processor Based SOC Test Platform"],"prefix":"10.1109","author":[{"family":"Kuen-Jong Lee","sequence":"first","affiliation":[]},{"family":"Chia-Yi Chu","sequence":"additional","affiliation":[]},{"family":"Yu-Ting Hong","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639596"},{"journal-title":"IEEE P1500 Web Site","year":"0","key":"2"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1018130"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/6.774966"},{"key":"7","first-page":"248","article-title":"a hierarchical test control architecture for core based design","author":"lee","year":"2000","journal-title":"Proc of Asian Test Symposium"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2001.915016"},{"key":"5","first-page":"628","article-title":"considerations for implementing ieee1149.1 on system-on-a-chip integrated circuits","author":"oakland","year":"2000","journal-title":"IEEE International Test Conference"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1998.670842"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2001.923439"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2002.998317"},{"key":"11","first-page":"124","article-title":"a sigma-delta modulation based bist scheme for a\/d converters","author":"lee","year":"2003","journal-title":"Asian Test Symposium"},{"journal-title":"Web site","year":"0","key":"12"}],"event":{"name":"2005 IEEE International Symposium on Circuits and Systems","location":"Kobe, Japan"},"container-title":["2005 IEEE International Symposium on Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9898\/31469\/01465254.pdf?arnumber=1465254","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T19:50:07Z","timestamp":1489521007000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1465254\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/iscas.2005.1465254","relation":{},"subject":[]}}