{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T11:56:31Z","timestamp":1759146991631},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/iscas.2005.1465399","type":"proceedings-article","created":{"date-parts":[[2005,7,27]],"date-time":"2005-07-27T13:52:28Z","timestamp":1122472348000},"page":"3563-3566","source":"Crossref","is-referenced-by-count":22,"title":["Timing Error Correction Techniques for Voltage-Scalable On-Chip Memories"],"prefix":"10.1109","author":[{"given":"E.","family":"Karl","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Sylvester","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Blaauw","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"3","DOI":"10.1109\/MICRO.2003.1253179"},{"doi-asserted-by":"publisher","key":"2","DOI":"10.1109\/4.913744"},{"doi-asserted-by":"publisher","key":"1","DOI":"10.1109\/CICC.2002.1012781"},{"doi-asserted-by":"publisher","key":"7","DOI":"10.1145\/605397.605403"},{"doi-asserted-by":"publisher","key":"6","DOI":"10.1109\/2.982917"},{"doi-asserted-by":"publisher","key":"5","DOI":"10.1109\/4.918909"},{"doi-asserted-by":"publisher","key":"4","DOI":"10.1049\/ip-cds:20020425"}],"event":{"name":"2005 IEEE International Symposium on Circuits and Systems","location":"Kobe, Japan"},"container-title":["2005 IEEE International Symposium on Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9898\/31469\/01465399.pdf?arnumber=1465399","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T19:49:58Z","timestamp":1489520998000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1465399\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/iscas.2005.1465399","relation":{},"subject":[]}}