{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T07:03:39Z","timestamp":1730271819956,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/iscas.2005.1465576","type":"proceedings-article","created":{"date-parts":[[2005,7,27]],"date-time":"2005-07-27T13:52:28Z","timestamp":1122472348000},"page":"4277-4280","source":"Crossref","is-referenced-by-count":1,"title":["High Voltage Tolerant Output Buffer Design for Mixed Voltage Interfaces"],"prefix":"10.1109","author":[{"given":"D.","family":"Mandal","sequence":"first","affiliation":[]},{"given":"P.","family":"Mandal","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/95.390308"},{"journal-title":"Basic ESD and I\/O Design","year":"1998","author":"dabral","key":"2"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/4.391124"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.1997.584255"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/4.799854"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/4.799855"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.800933"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/4.910493"},{"year":"0","key":"9"},{"key":"8","first-page":"97","article-title":"design of 2.5v\/ 5v mixed-voltage cmos i\/o buffer with only thin oxide device and dynamic n-well bias circuit","volume":"5","author":"ker","year":"2003","journal-title":"ISCAS"},{"key":"11","first-page":"577","article-title":"design on mixed-voltage-tolerant i\/o interface with novel tracking circuits in a 0.13-um cmos technology","volume":"2","author":"chuang","year":"2004","journal-title":"ISCAS"},{"article-title":"cmos output driver which can tolerate an output voltage greater than the supply voltage without latchup or increased leakage current","year":"1995","author":"heim","key":"12"}],"event":{"name":"2005 IEEE International Symposium on Circuits and Systems","location":"Kobe, Japan"},"container-title":["2005 IEEE International Symposium on Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9898\/31469\/01465576.pdf?arnumber=1465576","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,10,14]],"date-time":"2020-10-14T12:02:17Z","timestamp":1602676937000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/1465576"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/iscas.2005.1465576","relation":{},"subject":[]}}