{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T06:40:30Z","timestamp":1725432030766},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/iscas.2005.1465603","type":"proceedings-article","created":{"date-parts":[[2005,7,27]],"date-time":"2005-07-27T17:52:28Z","timestamp":1122486748000},"page":"4385-4388","source":"Crossref","is-referenced-by-count":8,"title":["Use of Source Degeneration for Non-Intrusive BIST of RF Front-end Circuits"],"prefix":"10.1109","author":[{"given":"A.","family":"Gopalan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Das","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.","family":"Washburn","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.R.","family":"Mukund","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/MCOM.2003.1232241"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/35.769281"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2002.998268"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.2005.52"},{"key":"5","first-page":"196","article-title":"a non-intrusive self-test methodology for rf cmos low noise amplifiers","author":"gopalan","year":"2004","journal-title":"Proc IEEE Mixed Signal Test Workshop 2004"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.2004.1261064"}],"event":{"name":"2005 IEEE International Symposium on Circuits and Systems","location":"Kobe, Japan"},"container-title":["2005 IEEE International Symposium on Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9898\/31469\/01465603.pdf?arnumber=1465603","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,10,14]],"date-time":"2020-10-14T16:02:25Z","timestamp":1602691345000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/1465603"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/iscas.2005.1465603","relation":{},"subject":[]}}