{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T08:48:39Z","timestamp":1725526119093},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/iscas.2005.1465826","type":"proceedings-article","created":{"date-parts":[[2005,7,27]],"date-time":"2005-07-27T13:52:28Z","timestamp":1122472348000},"page":"5278-5281","source":"Crossref","is-referenced-by-count":0,"title":["A Low-Power Scan-Path Architecture"],"prefix":"10.1109","author":[{"given":"S.","family":"Hatami","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Alisafaee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.","family":"Atoofian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Z.","family":"Navabi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Afzali-Kusha","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966620"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1993.313316"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2001.923454"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1145\/225871.225877"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639699"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008331029249"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.1994.282700"},{"key":"4","first-page":"386","article-title":"a bist methodology for comprehensivetesting of ram with reduced heat dissipation","author":"cheung","year":"1996","journal-title":"Proc IEEE Int'l Test Conf"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2002.1173513"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1999.810734"},{"key":"11","first-page":"49","article-title":"low power serial built-in self test","author":"hertwing","year":"1998","journal-title":"Proc IEEE European Test Workshop"}],"event":{"name":"2005 IEEE International Symposium on Circuits and Systems","location":"Kobe, Japan"},"container-title":["2005 IEEE International Symposium on Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9898\/31469\/01465826.pdf?arnumber=1465826","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T21:01:39Z","timestamp":1489525299000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1465826\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/iscas.2005.1465826","relation":{},"subject":[]}}