{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T07:07:22Z","timestamp":1730272042822,"version":"3.28.0"},"reference-count":4,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/iscas.2006.1693443","type":"proceedings-article","created":{"date-parts":[[2006,9,22]],"date-time":"2006-09-22T17:01:13Z","timestamp":1158944473000},"page":"4","source":"Crossref","is-referenced-by-count":4,"title":["Investigation of inductors for digital Si-CMOS technologies"],"prefix":"10.1109","author":[{"given":"R.","family":"Mukhopadhyay","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.W.","family":"Yoon","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Y.","family":"Park","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.-H.","family":"Lee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Nuttinck","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Laskar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1049\/el:19960669"},{"key":"2","first-page":"467","article-title":"Improved Quality-Factor of 0.18-?m CMOS Active Inductor by a Feedback Resistance Design","volume":"12","author":"hsiao","year":"2002","journal-title":"IEEE MWCLetters"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2004.839352"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2005.1516931"}],"event":{"name":"2006 IEEE International Symposium on Circuits and Systems","acronym":"ISCAS-06","location":"Island of Kos, Greece"},"container-title":["2006 IEEE International Symposium on Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/11145\/35661\/01693443.pdf?arnumber=1693443","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,15]],"date-time":"2017-03-15T17:35:35Z","timestamp":1489599335000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1693443\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":4,"URL":"https:\/\/doi.org\/10.1109\/iscas.2006.1693443","relation":{},"subject":[]}}