{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T06:00:42Z","timestamp":1725516042038},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/iscas.2006.1693663","type":"proceedings-article","created":{"date-parts":[[2006,9,22]],"date-time":"2006-09-22T17:01:13Z","timestamp":1158944473000},"page":"4635-4638","source":"Crossref","is-referenced-by-count":0,"title":["Validation of a Statistical Non-Linear Model of GaAs HEMT MMIC's by Hypothesis Testing and Principal Components Analysis"],"prefix":"10.1109","author":[{"given":"M.","family":"Balsi","sequence":"first","affiliation":[]},{"given":"F.","family":"Centurelli","sequence":"additional","affiliation":[]},{"given":"P.","family":"Marietti","sequence":"additional","affiliation":[]},{"given":"G.","family":"Scotti","sequence":"additional","affiliation":[]},{"given":"P.","family":"Tommasino","sequence":"additional","affiliation":[]},{"given":"A.","family":"Trifiletti","sequence":"additional","affiliation":[]},{"given":"G.","family":"Valente","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"year":"0","key":"13"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/16.853031"},{"year":"0","key":"11"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/ICIPRM.1997.600153"},{"year":"0","key":"3"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/22.146320"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.1988.22039"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/16.711380"},{"year":"0","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/22.898980"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/22.481384"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1002\/mmce.4570010304"},{"journal-title":"HELENA HEMT electrical properties and noise analysis software and users's manual","year":"1993","author":"happy","key":"9"},{"year":"0","key":"8"}],"event":{"name":"2006 IEEE International Symposium on Circuits and Systems","acronym":"ISCAS-06","location":"Island of Kos, Greece"},"container-title":["2006 IEEE International Symposium on Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/11145\/35661\/01693663.pdf?arnumber=1693663","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,15]],"date-time":"2017-03-15T17:25:57Z","timestamp":1489598757000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1693663\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/iscas.2006.1693663","relation":{},"subject":[]}}