{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T07:02:25Z","timestamp":1730271745475,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2008,5,1]],"date-time":"2008-05-01T00:00:00Z","timestamp":1209600000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2008,5,1]],"date-time":"2008-05-01T00:00:00Z","timestamp":1209600000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,5]]},"DOI":"10.1109\/iscas.2008.4541475","type":"proceedings-article","created":{"date-parts":[[2008,6,16]],"date-time":"2008-06-16T16:26:17Z","timestamp":1213633577000},"page":"544-547","source":"Crossref","is-referenced-by-count":5,"title":["Injection locking conditions under small periodic excitations"],"prefix":"10.1109","author":[{"given":"M.M.","family":"Gourary","sequence":"first","affiliation":[{"name":"IPPM, Russian Academy of Sciences, Moscow, Russian Federation"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.G.","family":"Rusakov","sequence":"additional","affiliation":[{"name":"IPPM, Russian Academy of Sciences, Moscow, Russian Federation"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.L.","family":"Ulyanov","sequence":"additional","affiliation":[{"name":"IPPM, Russian Academy of Sciences, Moscow, Russian Federation"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.M.","family":"Zharov","sequence":"additional","affiliation":[{"name":"IPPM, Russian Academy of Sciences, Moscow, Russian Federation"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"B.J.","family":"Mulvaney","sequence":"additional","affiliation":[{"name":"Freescale Semiconductor Inc., Austin, Texas, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.K.","family":"Gullapalli","sequence":"additional","affiliation":[{"name":"Freescale Semiconductor Inc., Austin, Texas, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"13","volume":"2","author":"stratonovich","year":"1967","journal-title":"Topics in the Theory of Random Noise"},{"journal-title":"Halbbeiter-Schaltungstechnik","year":"2002","author":"tietze","key":"14"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-2081-5"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2000.896487"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/4.766815"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2003.1249409"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/JRPROC.1946.229930"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2005.1568706"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/81.847872"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2005.1465873"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2006.320878"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.811975"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2004.1382663"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2002.1167539"}],"event":{"name":"2008 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2008,5,18]]},"location":"Seattle, WA, USA","end":{"date-parts":[[2008,5,21]]}},"container-title":["2008 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4534149\/4541329\/04541475.pdf?arnumber=4541475","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,16]],"date-time":"2024-02-16T01:20:49Z","timestamp":1708046449000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/4541475\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,5]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/iscas.2008.4541475","relation":{},"subject":[],"published":{"date-parts":[[2008,5]]}}}