{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T16:02:15Z","timestamp":1781884935588,"version":"3.54.5"},"reference-count":8,"publisher":"IEEE","license":[{"start":{"date-parts":[[2008,5,1]],"date-time":"2008-05-01T00:00:00Z","timestamp":1209600000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2008,5,1]],"date-time":"2008-05-01T00:00:00Z","timestamp":1209600000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,5]]},"DOI":"10.1109\/iscas.2008.4541662","type":"proceedings-article","created":{"date-parts":[[2008,6,16]],"date-time":"2008-06-16T16:26:17Z","timestamp":1213633577000},"page":"1292-1295","source":"Crossref","is-referenced-by-count":1,"title":["ESD protection design for fully integrated CMOS RF power amplifiers with waffle-structured SCR"],"prefix":"10.1109","author":[{"family":"Ming-Dou Ker","sequence":"first","affiliation":[{"name":"Nanoelectronics and Gigascale Systems Laboratory Institute of Electronics, National Chiao-Tung University Hsinchu, Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"family":"Chun-Yu Lin","sequence":"additional","affiliation":[{"name":"Nanoelectronics and Gigascale Systems Laboratory Institute of Electronics, National Chiao-Tung University Hsinchu, Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"family":"Guo-Xuan Meng","sequence":"additional","affiliation":[{"name":"Nanoelectronics and Gigascale Systems Laboratory Institute of Electronics, National Chiao-Tung University Hsinchu, Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2714(02)00049-5"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/IPFA.2005.1469132"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/RFIC.2004.1320534"},{"key":"7","year":"0"},{"key":"6","first-page":"749","article-title":"low-capacitance scr with waffle layout structure for on-chip esd protection in rf ics","author":"lin","year":"2007","journal-title":"RFIC Symp Dig"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/EOSESD.2000.890084"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/4.859509"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/16.737457"}],"event":{"name":"2008 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Seattle, WA, USA","start":{"date-parts":[[2008,5,18]]},"end":{"date-parts":[[2008,5,21]]}},"container-title":["2008 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4534149\/4541329\/04541662.pdf?arnumber=4541662","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,16]],"date-time":"2024-02-16T01:23:35Z","timestamp":1708046615000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/4541662\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,5]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/iscas.2008.4541662","relation":{},"subject":[],"published":{"date-parts":[[2008,5]]}}}