{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T23:02:33Z","timestamp":1762297353377},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2008,5,1]],"date-time":"2008-05-01T00:00:00Z","timestamp":1209600000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2008,5,1]],"date-time":"2008-05-01T00:00:00Z","timestamp":1209600000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,5]]},"DOI":"10.1109\/iscas.2008.4541839","type":"proceedings-article","created":{"date-parts":[[2008,6,16]],"date-time":"2008-06-16T16:26:17Z","timestamp":1213633577000},"page":"2002-2005","source":"Crossref","is-referenced-by-count":8,"title":["Baseline resistance cancellation circuit for high resolution thiolate-monolayer-protected gold nanoparticle vapor sensor arrays"],"prefix":"10.1109","author":[{"given":"D.","family":"Rairigh","sequence":"first","affiliation":[{"name":"Michigan State Univ., East Lansing, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Mason","sequence":"additional","affiliation":[{"name":"Michigan State Univ., East Lansing, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M. P.","family":"Rowe","sequence":"additional","affiliation":[{"name":"Univ. of Michigan, Ann Arbor, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E. T.","family":"Zellers","sequence":"additional","affiliation":[{"name":"Univ. of Michigan, Ann Arbor, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1021\/ac070068y"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2004.09.003"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENS.2003.1279118"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1039\/b508596a"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1021\/ac9713464"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.831500"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.899087"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1039\/b700216e"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2005.1604176"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2006.870156"}],"event":{"name":"2008 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2008,5,18]]},"location":"Seattle, WA, USA","end":{"date-parts":[[2008,5,21]]}},"container-title":["2008 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4534149\/4541329\/04541839.pdf?arnumber=4541839","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,16]],"date-time":"2024-02-16T01:24:14Z","timestamp":1708046654000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/4541839\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,5]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/iscas.2008.4541839","relation":{},"subject":[],"published":{"date-parts":[[2008,5]]}}}