{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,29]],"date-time":"2025-04-29T16:32:50Z","timestamp":1745944370207},"reference-count":7,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,5]]},"DOI":"10.1109\/iscas.2008.4542157","type":"proceedings-article","created":{"date-parts":[[2008,6,16]],"date-time":"2008-06-16T12:26:17Z","timestamp":1213619177000},"page":"3274-3277","source":"Crossref","is-referenced-by-count":3,"title":["A 2.5MHz, 97%-accuracy on-chip current sensor with dynamically-biased shunt feedback for current-mode switching DC-DC converters"],"prefix":"10.1109","author":[{"family":"Mengmeng Du","sequence":"first","affiliation":[]},{"family":"Hoi Lee","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.820870"},{"key":"2","first-page":"265","article-title":"on-chip current sensing technique for cmos monolithic switch-mode power converters","author":"lee","year":"2002","journal-title":"Proc IEEE Symp Circuits and Systems"},{"article-title":"current sensing technique using mos transistors scaling with matched bipolar current sources","year":"1998","author":"ki","key":"1"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.891721"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2004.1329936"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2005.850403"},{"key":"4","first-page":"824","article-title":"a 1.2-v buck converter with a novel on-chip low-voltage current-sensing scheme","author":"leung","year":"2004","journal-title":"Proc IEEE Symp Circuits and Systems"}],"event":{"name":"2008 IEEE International Symposium on Circuits and Systems - ISCAS 2008","start":{"date-parts":[[2008,5,18]]},"location":"Seattle, WA, USA","end":{"date-parts":[[2008,5,21]]}},"container-title":["2008 IEEE International Symposium on Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4534149\/4541329\/04542157.pdf?arnumber=4542157","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T12:24:18Z","timestamp":1489667058000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4542157\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,5]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/iscas.2008.4542157","relation":{},"subject":[],"published":{"date-parts":[[2008,5]]}}}