{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,11]],"date-time":"2025-02-11T05:17:22Z","timestamp":1739251042931,"version":"3.37.0"},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,5]]},"DOI":"10.1109\/iscas.2009.5117765","type":"proceedings-article","created":{"date-parts":[[2009,7,1]],"date-time":"2009-07-01T14:59:27Z","timestamp":1246460367000},"page":"381-384","source":"Crossref","is-referenced-by-count":8,"title":["A precise Negative Bias Temperature Instability sensor using slew-rate monitor circuitry"],"prefix":"10.1109","author":[{"given":"Amlan","family":"Ghosh","sequence":"first","affiliation":[]},{"given":"Richard B.","family":"Brown","sequence":"additional","affiliation":[]},{"given":"Rahul M.","family":"Rao","sequence":"additional","affiliation":[]},{"given":"Ching-Te","family":"Chuang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"CMOS Circuit Design layout and Simulation Chap 26","year":"1996","author":"baker","key":"19"},{"article-title":"digital integrated circuits (2nd edition)","year":"2002","author":"rabaey","key":"17"},{"key":"18","doi-asserted-by":"crossref","DOI":"10.1109\/VLSI.2008.67","article-title":"on-chip process variation detection using slew-rate monitoring circuit in sub-100nm cmos technology","author":"ghosh","year":"2008","journal-title":"IEEE VLSI Design"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/APCAS.1996.569223"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/4.658636"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/4.52187"},{"year":"0","key":"14"},{"year":"0","key":"11"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/4.400428"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147172"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDER.2005.1546669"},{"key":"1","first-page":"40","article-title":"hole trapping effect on methodology for dc and ac negative bias temperature instability measurements in pmos transistors","author":"huard","year":"2004","journal-title":"IEEE International Reliability Physics Symposium"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1145\/1283780.1283821"},{"key":"7","first-page":"109","article-title":"on-the-fly characterization of nbti in ultra-thin gate oxide pmosfet's","author":"denais","year":"2004","journal-title":"IEEE International Electron Devices Meeting"},{"key":"6","first-page":"205","article-title":"an analytical model for negative bias temperature instability","author":"kumar","year":"2006","journal-title":"IEEE International Conference on Computer-Aided Design"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2004.03.019"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2004.833592"},{"key":"9","first-page":"122","article-title":"silicon odometer: an on-chip reliability monitor for measuring frequency degradation of digital circuits","author":"tae-hyoung kim","year":"2007","journal-title":"IEEE Symposium on VLSI Circuits"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2006.251349"}],"event":{"name":"2009 IEEE International Symposium on Circuits and Systems - ISCAS 2009","start":{"date-parts":[[2009,5,24]]},"location":"Taipei, Taiwan","end":{"date-parts":[[2009,5,27]]}},"container-title":["2009 IEEE International Symposium on Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5076158\/5117665\/05117765.pdf?arnumber=5117765","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,10]],"date-time":"2025-02-10T15:40:59Z","timestamp":1739202059000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5117765\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,5]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/iscas.2009.5117765","relation":{},"subject":[],"published":{"date-parts":[[2009,5]]}}}