{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T12:27:52Z","timestamp":1725452872978},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,5]]},"DOI":"10.1109\/iscas.2010.5536967","type":"proceedings-article","created":{"date-parts":[[2010,8,9]],"date-time":"2010-08-09T22:13:20Z","timestamp":1281392000000},"page":"2892-2895","source":"Crossref","is-referenced-by-count":0,"title":["Monitoring and reconfiguration techniques for power supply variation tolerant on-chip links"],"prefix":"10.1109","author":[{"given":"Ethiopia","family":"Nigussie","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Juha","family":"Plosila","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jouni","family":"Isoaho","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1049\/el:20064368"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/ISCAS.2005.1465542"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/JSSC.2007.910957"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1049\/el.2009.0403"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/SOCC.2008.4641498"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1155\/2007\/46514"},{"key":"ref8","first-page":"706","article-title":"Efficient Modeling Techniques for Dynamic Voltage Drop Analysis","author":"harizi","year":"2007","journal-title":"44th ACM\/IEEE Design Automation Conference"},{"key":"ref7","first-page":"298","article-title":"Comparison of Split-Versus Connected-Core Supplies in the POWER6™ Microprocessor","author":"james","year":"0","journal-title":"2007 IEEE International Solid-State Circuits Conference Power Management Papers"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/MM.2002.1044296"},{"key":"ref9","article-title":"BSIM4.6.4 MOSFET Model-User's Manual","author":"morshed","year":"2009","journal-title":"Department of Electrical Engineering and Computer Sciences"},{"year":"2008","author":"orshansky","article-title":"Design for Manufacturability and Statistical Design A Constructive Approach","key":"ref1"}],"event":{"name":"2010 IEEE International Symposium on Circuits and Systems - ISCAS 2010","start":{"date-parts":[[2010,5,30]]},"location":"Paris, France","end":{"date-parts":[[2010,6,2]]}},"container-title":["Proceedings of 2010 IEEE International Symposium on Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5512009\/5536941\/05536967.pdf?arnumber=5536967","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T22:40:13Z","timestamp":1489876813000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5536967\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,5]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/iscas.2010.5536967","relation":{},"subject":[],"published":{"date-parts":[[2010,5]]}}}