{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,29]],"date-time":"2024-08-29T07:09:26Z","timestamp":1724915366468},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,5]]},"DOI":"10.1109\/iscas.2011.5937502","type":"proceedings-article","created":{"date-parts":[[2011,7,7]],"date-time":"2011-07-07T17:30:57Z","timestamp":1310059857000},"source":"Crossref","is-referenced-by-count":3,"title":["A novel technique to measure data retention voltage of large SRAM arrays"],"prefix":"10.1109","author":[{"given":"Farah B.","family":"Yahya","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mohammad","family":"Mansour","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ali","family":"Chehab","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1987.1052809"},{"key":"ref11","article-title":"SRAM leakage suppression by minimizing standby supply voltage","author":"qin","year":"2004","journal-title":"IEEE Computer Society"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2007160"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.914720"},{"key":"ref14","author":"bushnell","year":"2001","journal-title":"Essentials of Electronic Testing For Digital Memory & Mixed-Signal VLSI Circuits"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/APACE.2007.4603901"},{"key":"ref16","year":"0","journal-title":"ITRS Roadmap"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/N-SSC.2006.4785853"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2007.4418976"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364490"},{"key":"ref3","first-page":"400","article-title":"Statistical modeling for the minimum standby supply voltage of a full SRAM array","author":"wang","year":"2007","journal-title":"ESSCIRC"},{"key":"ref6","article-title":"Mixture Importance Sampling and its application to the analysis of SRAM designs in the presence of rare failure events","author":"kanj","year":"2006","journal-title":"IEEE Design Automation Conf"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI.2008.54"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.859886"},{"key":"ref7","first-page":"230","article-title":"Importance Sampling Monte Carlo simulations for accurate rstimation of SRAM yield","author":"doorn","year":"2008","journal-title":"Proc Eur Solid-State Conf"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIR.2005.1541635"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/4.913744"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/N-SSC.2008.4785819"}],"event":{"name":"2011 IEEE International Symposium on Circuits and Systems (ISCAS)","location":"Rio de Janeiro, Brazil","start":{"date-parts":[[2011,5,15]]},"end":{"date-parts":[[2011,5,18]]}},"container-title":["2011 IEEE International Symposium of Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5910713\/5937406\/05937502.pdf?arnumber=5937502","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T10:04:28Z","timestamp":1490090668000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5937502\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,5]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/iscas.2011.5937502","relation":{},"subject":[],"published":{"date-parts":[[2011,5]]}}}