{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T08:03:37Z","timestamp":1729670617543,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,5]]},"DOI":"10.1109\/iscas.2011.5937721","type":"proceedings-article","created":{"date-parts":[[2011,7,7]],"date-time":"2011-07-07T17:30:57Z","timestamp":1310059857000},"page":"937-940","source":"Crossref","is-referenced-by-count":2,"title":["Electrical characteristics of novel ESD protection devices for I\/O and power clamp"],"prefix":"10.1109","author":[{"given":"Yong-Seo","family":"Koo","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kwang-Yeob","family":"Lee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Joong-Ho","family":"Choi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chan-Ho","family":"Lee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yoon-Sik","family":"Lee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yil-Suk","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2005.861601"},{"key":"ref3","first-page":"22","article-title":"GGSCR: GGNMOS triggered silicon controlled rectifiers for ESD protection in deep submicron CMOS processes","author":"russ","year":"0","journal-title":"Proc EOS\/ESD Symp"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/EOSESD.1998.737036"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/4.553176"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/55.75685"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2004.834736"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2003.815192"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"273","DOI":"10.1109\/TDMR.2004.826584","article-title":"High Holding Voltage Cascoded LVTSCR Structure for 5.5V Tolerant ESD Protection Clamp","volume":"4","author":"vladislav","year":"2004","journal-title":"IEEE Trans Device Mater Rel"},{"key":"ref9","first-page":"336","article-title":"Does the TLP Failure Current obtained by Transmission Line Pulsing always correlate to Human body model tests?","author":"stadler","year":"0","journal-title":"Proc EOS\/ESD Symp"},{"key":"ref1","first-page":"49","article-title":"Extend and cost of EOS\/ESD Damage in an IC Manufacturing Process","author":"wagner","year":"0","journal-title":"Proc 15th EOS\/ESD Symp"}],"event":{"name":"2011 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2011,5,15]]},"location":"Rio de Janeiro, Brazil","end":{"date-parts":[[2011,5,18]]}},"container-title":["2011 IEEE International Symposium of Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5910713\/5937406\/05937721.pdf?arnumber=5937721","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,20]],"date-time":"2017-06-20T02:56:58Z","timestamp":1497927418000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5937721\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,5]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/iscas.2011.5937721","relation":{},"subject":[],"published":{"date-parts":[[2011,5]]}}}