{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T00:38:22Z","timestamp":1725755902368},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,5]]},"DOI":"10.1109\/iscas.2012.6271804","type":"proceedings-article","created":{"date-parts":[[2012,8,22]],"date-time":"2012-08-22T12:02:44Z","timestamp":1345636964000},"page":"2485-2488","source":"Crossref","is-referenced-by-count":2,"title":["An all-digital bit transistor characterization scheme for CMOS 6T SRAM array"],"prefix":"10.1109","author":[{"given":"Geng-Cing","family":"Lin","sequence":"first","affiliation":[]},{"given":"Shao-Cheng","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Yi-Wei","family":"Lin","sequence":"additional","affiliation":[]},{"given":"Ming-Chien","family":"Tsai","sequence":"additional","affiliation":[]},{"given":"Ching-Te","family":"Chuang","sequence":"additional","affiliation":[]},{"given":"Shyh-Jye","family":"Jou","sequence":"additional","affiliation":[]},{"given":"Nan-Chun","family":"Lien","sequence":"additional","affiliation":[]},{"given":"Wei-Chiang","family":"Shih","sequence":"additional","affiliation":[]},{"given":"Kuen-Di","family":"Lee","sequence":"additional","affiliation":[]},{"given":"Jyun-Kai","family":"Chu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2008.2010729"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.2008.4509305"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2008.2004329"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/MTDT.2007.4547603"},{"key":"7","first-page":"44","article-title":"Characterization of bit transistors in a functional SRAM","author":"deng","year":"2008","journal-title":"Digest of Technical Papers Symposium on VLSI Circuits"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2005.1609437"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2025342"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2001896"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2008.4585944"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2009.02.012"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2009.5325952"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.917502"}],"event":{"name":"2012 IEEE International Symposium on Circuits and Systems - ISCAS 2012","start":{"date-parts":[[2012,5,20]]},"location":"Seoul, Korea (South)","end":{"date-parts":[[2012,5,23]]}},"container-title":["2012 IEEE International Symposium on Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6257548\/6270389\/06271804.pdf?arnumber=6271804","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T20:33:54Z","timestamp":1490128434000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6271804\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,5]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/iscas.2012.6271804","relation":{},"subject":[],"published":{"date-parts":[[2012,5]]}}}