{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T04:39:18Z","timestamp":1725511158782},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/iscas.2013.6571855","type":"proceedings-article","created":{"date-parts":[[2013,8,14]],"date-time":"2013-08-14T15:40:23Z","timestamp":1376494823000},"page":"316-364","source":"Crossref","is-referenced-by-count":0,"title":["10b 150MS\/s 0.4mm<sup>2<\/sup> 45nm CMOS ADC based on process-insensitive amplifiers"],"prefix":"10.1109","author":[{"family":"Tai-Ji An","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Jun-Sang Park","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Yong-Min Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Suk-Hee Cho","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Gil-Cho Ahn","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Seung-Hoon Lee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","first-page":"226","article-title":"A 15mW 0.2mm2 10b 50MS\/s ADC with wide input range","author":"choi","year":"2006","journal-title":"ISSCC Dig Tech Papers"},{"key":"2","first-page":"4041","article-title":"A 10-bit 300M sample\/s pipelined ADC using time-interleaved SAR ADC for front-end stages","author":"kim","year":"2010","journal-title":"IEEE Int Symp Circuits and Systems"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2003.820253"},{"key":"1","first-page":"1023","article-title":"A 3.0V 72mW 10b 100M sample\/s nyquist-rate CMOS pipelined ADC in 0.54mm2","author":"oh","year":"2006","journal-title":"IEEE Int Symp Circuits and Systems"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/4.972143"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1587\/transele.E92.C.1194"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2010.5617409"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/4.557628"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/4.62165"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2022217"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1049\/el:20060454"}],"event":{"name":"2013 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2013,5,19]]},"location":"Beijing","end":{"date-parts":[[2013,5,23]]}},"container-title":["2013 IEEE International Symposium on Circuits and Systems (ISCAS2013)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6560459\/6571764\/06571855.pdf?arnumber=6571855","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T21:30:14Z","timestamp":1490218214000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6571855\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/iscas.2013.6571855","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}