{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T07:56:56Z","timestamp":1725523016811},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/iscas.2013.6572022","type":"proceedings-article","created":{"date-parts":[[2013,8,14]],"date-time":"2013-08-14T15:40:23Z","timestamp":1376494823000},"page":"1018-1021","source":"Crossref","is-referenced-by-count":0,"title":["A power-efficient scan tree design by exploring the Q'-D connection"],"prefix":"10.1109","author":[{"family":"Linfeng Chen","sequence":"first","affiliation":[]},{"family":"Aijiao Cui","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2003.1250798"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1003802"},{"key":"10","first-page":"1","article-title":"California scan architecture for high quality and low power testing","author":"cho","year":"2007","journal-title":"Proc IEEE Int Test Conf"},{"key":"1","first-page":"9","article-title":"A unified solution to scan test volume, time, and power minimization","author":"zhen","year":"2010","journal-title":"Proceedings of 11th International Conference on VLSI Design"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/ETSYM.2004.1347657"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2003.1250772"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ASICON.2009.5351359"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2004.61"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2011.5985911"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041833"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2005.62"}],"event":{"name":"2013 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2013,5,19]]},"location":"Beijing","end":{"date-parts":[[2013,5,23]]}},"container-title":["2013 IEEE International Symposium on Circuits and Systems (ISCAS2013)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6560459\/6571764\/06572022.pdf?arnumber=6572022","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,10,14]],"date-time":"2020-10-14T15:34:00Z","timestamp":1602689640000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6572022"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/iscas.2013.6572022","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}