{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,8]],"date-time":"2025-10-08T15:31:16Z","timestamp":1759937476847},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,5]]},"DOI":"10.1109\/iscas.2013.6572420","type":"proceedings-article","created":{"date-parts":[[2013,8,14]],"date-time":"2013-08-14T11:40:23Z","timestamp":1376480423000},"page":"2638-2641","source":"Crossref","is-referenced-by-count":3,"title":["Low-leakage power-rail ESD clamp circuit with gated current mirror in a 65-nm CMOS technology"],"prefix":"10.1109","author":[{"given":"Federico A.","family":"Altolaguirre","sequence":"first","affiliation":[]},{"family":"Ming-Dou Ker","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","first-page":"815","article-title":"Bsim4 gate leakage model including source-drain partition","author":"cao et al","year":"2000","journal-title":"IEDM Tech Dig"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/16.930653"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/16.737457"},{"key":"7","first-page":"77","article-title":"ESD Protection for High-Voltage CMOS Technologies","author":"olivier quittard","year":"2006","journal-title":"2006 Electrical Overstress\/Electrostatic Discharge Symposium eos\/esd"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2009.5118254"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ICICDT.2011.5783185"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.846824"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2005.845112"}],"event":{"name":"2013 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2013,5,19]]},"location":"Beijing","end":{"date-parts":[[2013,5,23]]}},"container-title":["2013 IEEE International Symposium on Circuits and Systems (ISCAS2013)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6560459\/6571764\/06572420.pdf?arnumber=6572420","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T17:34:00Z","timestamp":1490204040000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6572420\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,5]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/iscas.2013.6572420","relation":{},"subject":[],"published":{"date-parts":[[2013,5]]}}}