{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T09:39:02Z","timestamp":1729676342963,"version":"3.28.0"},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,6]]},"DOI":"10.1109\/iscas.2014.6865413","type":"proceedings-article","created":{"date-parts":[[2014,7,30]],"date-time":"2014-07-30T21:16:29Z","timestamp":1406754989000},"page":"1428-1431","source":"Crossref","is-referenced-by-count":0,"title":["Origin of stochastic resistive switching in devices with phenomenologically identical initial states"],"prefix":"10.1109","author":[{"given":"Qingjiang","family":"Li","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ali","family":"Khiat","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Iulia","family":"Salaoru","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hui","family":"Xu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Themistoklis","family":"Prodromakis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2013.2251314"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2167513"},{"key":"17","doi-asserted-by":"crossref","first-page":"411","DOI":"10.1002\/adma.200901493","article-title":"Impact of defect distribution on resistive switching characteristics of Sr2TiO4 thin films","volume":"22","author":"shibuya","year":"2010","journal-title":"Advanced Materials"},{"key":"18","doi-asserted-by":"crossref","first-page":"96401","DOI":"10.7498\/aps.62.096401","article-title":"Effects of pristine state on conductive percolation model of memristor","volume":"62","author":"zhi-wei","year":"2013","journal-title":"Acta Phys Sin"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1002\/adma.200900375"},{"journal-title":"Modelling of Current Percolation Channels in Emerging Resistive Switching Elements","year":"2012","author":"shihong","key":"16"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.82.155321"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1038\/nmat2009"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms1737"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2008.160"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1002\/adma.200702024"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1016\/j.neunet.2010.05.001"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2013.2266332"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1038\/nmat2748"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1038\/nmat2023"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1002\/pssr.200802054"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2010.5703391"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1038\/nature06932"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/24\/38\/384010"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1021\/nl904092h"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1063\/1.3151822"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1038\/srep00744"}],"event":{"name":"2014 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2014,6,1]]},"location":"Melbourne VIC, Australia","end":{"date-parts":[[2014,6,5]]}},"container-title":["2014 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6852006\/6865048\/06865413.pdf?arnumber=6865413","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,13]],"date-time":"2022-04-13T05:05:59Z","timestamp":1649826359000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6865413\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,6]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/iscas.2014.6865413","relation":{},"subject":[],"published":{"date-parts":[[2014,6]]}}}