{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T23:45:27Z","timestamp":1729640727318,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,6]]},"DOI":"10.1109\/iscas.2014.6865423","type":"proceedings-article","created":{"date-parts":[[2014,7,30]],"date-time":"2014-07-30T21:16:29Z","timestamp":1406754989000},"page":"1468-1471","source":"Crossref","is-referenced-by-count":3,"title":["Abstracting Single Event Transient characteristics variations due to input patterns and fan-out"],"prefix":"10.1109","author":[{"given":"Ghaith","family":"Bany Hamad","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Syed","family":"Rafay Hasan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Otmane","family":"Ait Mohamed","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yvon","family":"Savaria","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.910125"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2008.2006265"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2305434"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271075"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1147\/rd.401.0109"},{"journal-title":"Architecture Design for Soft Errors","year":"2011","author":"mukherjee","key":"1"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2011.6131344"},{"key":"7","volume":"2","author":"rabaey","year":"2003","journal-title":"Digital Integrated Circuits"},{"key":"6","first-page":"5","author":"savaria","year":"1985","journal-title":"The Design of Digital Machines Tolerant to Soft Errors"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2007.100"},{"key":"4","doi-asserted-by":"crossref","first-page":"755","DOI":"10.1109\/ISQED.2006.64","article-title":"FASER: Fast analysis of soft error susceptibility for cell-based designs","author":"zhang","year":"2006","journal-title":"Proceedings of the 7th International Symposium on Quality Electronic Design"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.910202"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2002.1028924"}],"event":{"name":"2014 IEEE International Symposium on Circuits and Systems (ISCAS)","start":{"date-parts":[[2014,6,1]]},"location":"Melbourne VIC, Australia","end":{"date-parts":[[2014,6,5]]}},"container-title":["2014 IEEE International Symposium on Circuits and Systems (ISCAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6852006\/6865048\/06865423.pdf?arnumber=6865423","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,22]],"date-time":"2017-06-22T17:37:30Z","timestamp":1498153050000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6865423\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,6]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/iscas.2014.6865423","relation":{},"subject":[],"published":{"date-parts":[[2014,6]]}}}